L. Langof

475 citations
18 papers · 331 · h-index 10

Impact in

Papers in

L. Langof

17 papers receiving 300 citations

Peers

L. Langof
Comparison fields: 5 of 37
  • Electrical and Electronic Engineering 296
  • Instrumentation 17
  • Materials Chemistry 211
  • Atomic and Molecular Physics, and Optics 107
  • Aerospace Engineering 41
Replace S. N. Nesmelov with:
S. N. Nesmelov Russia
S. М. Dzyadukh Russia
L. Joulaud France
K. Vaccaro United States
David E. Franz United States
Y. Nishijima Japan
Aaron J. Muhowski United States
Zhiqingzi Chen China
Sisheng Qi China
E. V. Grushko Ukraine
L. Langof relative to S. N. Nesmelov Russia S. N. Nesmelov's profile →
Citations per field
00.5×1.7×
S. N. Nesmelov · 1×
Citations per year

Countries citing papers authored by L. Langof

Since Specialization
Citations

This map shows the geographic impact of L. Langof's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Langof with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Langof more than expected).

Fields of papers citing papers by L. Langof

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Langof. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Langof. The network helps show where L. Langof may publish in the future.

Co-authors

The 25 scholars most cited alongside L. Langof, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with L. Langof Line = papers co-authored together L. Langof links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1 200289
2 200243
3 201640
4 200436
5 200324
6 200318
7 201816
8 201512
9 20129
10 20209
11 20119
12 20189
13 20175
14 20045
15 20213
16 19992
17 20232
18 20220

About L. Langof

L. Langof is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Aerospace Engineering and Astronomy and Astrophysics, having authored 18 papers that have together received 331 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (9 papers), Semiconductor Quantum Structures and Devices (8 papers), Chalcogenide Semiconductor Thin Films (8 papers), Quantum Dots Synthesis And Properties (6 papers), Infrared Target Detection Methodologies (3 papers), Calibration and Measurement Techniques (2 papers), Nanocluster Synthesis and Applications (2 papers) and CCD and CMOS Imaging Sensors (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (296 citations), Instrumentation (17 citations), Materials Chemistry (211 citations), Atomic and Molecular Physics, and Optics (107 citations) and Aerospace Engineering (41 citations). L. Langof has collaborated with scholars based in Israel, United States and Germany. Frequent co-authors include Efrat Lifshitz, R. Chaim, Aldona Sashchiuk, A. Glozman, Arthur J. Nozik, O. I. Mićić, E. Ehrenfreund, Eliezer Weiss, Inna Lukomsky and N. Snapi. Their work appears in journals such as Journal of Electronic Materials, Journal of Crystal Growth, Chemical Physics, ChemPhysChem and Annual Review of Physical Chemistry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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