Ming-Dou Ker

1.1k citations
77 papers · 851 · h-index 16

Impact in

  • Electrical and Electronic Engineering top 5%
    • Electrostatic Discharge in Electronics
    • Integrated Circuits and Semiconductor Failure Analysis
    • Electromagnetic Compatibility and Noise Suppression
    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Silicon Carbide Semiconductor Technologies
    • Thin-Film Transistor Technologies
  • Hardware and Architecture top 10%
    • Physical Unclonable Functions (PUFs) and Hardware Security

Papers in

  • Electrical and Electronic Engineering 73
    • Electrostatic Discharge in Electronics 68
    • Integrated Circuits and Semiconductor Failure Analysis 49
    • Electromagnetic Compatibility and Noise Suppression 37
    • Semiconductor materials and devices 28
    • Advancements in Semiconductor Devices and Circuit Design 11
    • Silicon Carbide Semiconductor Technologies 4
    • 3D IC and TSV technologies 4
  • Hardware and Architecture 4
Co-authors
Kai‐Cheng Hsu (1 shared paper)Chung‐Yu Wu (10 shared papers)Hun-Hsien Chang (4 shared papers)Shih‐Hung Chen (4 shared papers)Li-Wei Chu (2 shared papers)Po‐Tsun Liu (1 shared paper)Hao Tang (1 shared paper)Shih-Wei Sun (1 shared paper)
Journals
IEEE Transactions on Electron Devices (8 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IEEE Journal of Solid-State Circuits (2 papers)IEEE Electron Device Letters (2 papers)Japanese Journal of Applied Physics (2 papers)
Partner nations
TaiwanUnited States

In The Last Decade

Ming-Dou Ker

69 papers receiving 824 citations

Peers

Ming-Dou Ker
Comparison fields: 5 of 29
  • Electrical and Electronic Engineering 832
  • Hardware and Architecture 40
  • Condensed Matter Physics 9
  • Cellular and Molecular Neuroscience 12
  • Biomedical Engineering 24
Replace Jim Holmes with:
Jim Holmes United States
Weihai Bu China
Shunichi Kaeriyama Japan
Simon Thomann Germany
Sungbong Kim South Korea
Javier A. Salcedo United States
X. Li Singapore
A. Nackaerts Belgium
Chenming Hu United States
K. C. Ting Taiwan
Ming-Dou Ker relative to Jim Holmes United States Jim Holmes's profile →
Citations per field
00.5×2×3.4×
Jim Holmes · 1×
Citations per year

Countries citing papers authored by Ming-Dou Ker

Since Specialization
Citations

This map shows the geographic impact of Ming-Dou Ker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ming-Dou Ker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ming-Dou Ker more than expected).

Fields of papers citing papers by Ming-Dou Ker

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ming-Dou Ker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ming-Dou Ker. The network helps show where Ming-Dou Ker may publish in the future.

Co-authors

The 25 scholars most cited alongside Ming-Dou Ker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ming-Dou Ker Line = papers co-authored together Ming-Dou Ker links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 77 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits
IEEE Transactions on Device and Materials Reliability ·Ming-Dou Ker, Kai‐Cheng Hsu
2005189
2
Complementary-LVTSCR ESD protection circuit for submicron CMOS VLSI/ULSI
IEEE Transactions on Electron Devices ·Ming-Dou Ker, Chung‐Yu Wu, Hun-Hsien Chang
199655
3
Modeling the positive-feedback regenerative process of CMOS latchup by a positive transient pole method. I. theoretical derivation
IEEE Transactions on Electron Devices ·Ming-Dou Ker, Chung‐Yu Wu
199538
4
Design of Integrated Gate Driver With Threshold Voltage Drop Cancellation in Amorphous Silicon Technology for TFT-LCD Application
Journal of Display Technology ·Li-Wei Chu, Po‐Tsun Liu, Ming-Dou Ker
201133
5
ESD test methods on integrated circuits: an overview
Ming-Dou Ker, Jeng-Jie Peng, Hsin-Chin Jiang
200230
6
SCR device with double-triggered technique for on-chip ESD protection in sub-quarter-micron silicided CMOS processes
IEEE Transactions on Device and Materials Reliability ·Ming-Dou Ker, Kuo-Chun Hsu
200325
7
Area-Efficient ESD-Transient Detection Circuit With Smaller Capacitance for On-Chip Power-Rail ESD Protection in CMOS ICs
IEEE Transactions on Circuits & Systems II Express Briefs ·Shih‐Hung Chen, Ming-Dou Ker
200925
8
Novel input ESD protection circuit with substrate-triggering technique in a 0.25-μm shallow-trench-isolation CMOS technology
Ming-Dou Ker, Tung-Yang Chen, Chung‐Yu Wu, Hao Tang, Kuan-Cheng Su, Shih-Wei Sun
200224
9
Active ESD Protection Design for Interface Circuits Between Separated Power Domains Against Cross-Power-Domain ESD Stresses
IEEE Transactions on Device and Materials Reliability ·Shih‐Hung Chen, Ming-Dou Ker, Hsiang-Pin Hung
200823
10
Overview on electrostatic discharge protection designs for mixed-voltage I/O interfaces: design concept and circuit implementations
IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications ·Ming-Dou Ker, Kai Lin
200622
11
New Layout Arrangement to Improve ESD Robustness of Large-Array High-Voltage nLDMOS
IEEE Electron Device Letters ·Wen-Yi Chen, Ming-Dou Ker
201022
12
Design of 2.5 V/5 V mixed-voltage CMOS I/O buffer with only thin oxide device and dynamic N-well bias circuit
Ming-Dou Ker, Chia-Sheng Tsai
200319
13
Substrate-triggered technique for on-chip ESD protection design in a 0.18-μm salicided CMOS process
IEEE Transactions on Electron Devices ·Ming-Dou Ker, Tung‐Yang Chen
200318
14
Design of negative high voltage generator for biphasic stimulator with soc integration consideration
Ya-Chun Huang, Ming-Dou Ker, Chun-Yu Lin
201216
15
Fully process-compatible layout design on bond pad to improve wire bond reliability in CMOS ICs
IEEE Transactions on Components and Packaging Technologies ·Ming-Dou Ker, Jeng-Jie Peng
200216
16
Complementary-SCR ESD protection circuit with interdigitated finger-type layout for input pads of submicron CMOS IC's
IEEE Transactions on Electron Devices ·Ming-Dou Ker, Chung‐Yu Wu
199515
17
Layout design on multi-finger MOSFET for on-chip ESD protection circuits in a 0.18-μm salicided CMOS process
Ming-Dou Ker, Che-Hao Chuang, Wen-Yu Lo
200214
18
A new on-chip ESD protection circuit with dual parasitic SCR structures for CMOS VLSI
IEEE Journal of Solid-State Circuits ·Chung‐Yu Wu, Ming-Dou Ker, Chung-Yuan Lee, Joe Ko
199213
19
Substrate-triggered ESD protection circuit without extra process modification
IEEE Journal of Solid-State Circuits ·Ming-Dou Ker, Tung-Yang Chen
200312
20
Modeling the positive-feedback regenerative process of CMOS latchup by a positive transient pole method. II. Quantitative evaluation
IEEE Transactions on Electron Devices ·Ming-Dou Ker, Chung-Yu Wu
199511

About Ming-Dou Ker

Ming-Dou Ker is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Cellular and Molecular Neuroscience, Biomedical Engineering and Neurology, having authored 77 papers that have together received 851 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (68 papers), Integrated Circuits and Semiconductor Failure Analysis (49 papers), Electromagnetic Compatibility and Noise Suppression (37 papers), Semiconductor materials and devices (28 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Silicon Carbide Semiconductor Technologies (4 papers), 3D IC and TSV technologies (4 papers) and Neuroscience and Neural Engineering (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (832 citations), Hardware and Architecture (40 citations), Condensed Matter Physics (9 citations), Cellular and Molecular Neuroscience (12 citations) and Biomedical Engineering (24 citations). Ming-Dou Ker has collaborated with scholars based in Taiwan and United States. Frequent co-authors include Kai‐Cheng Hsu, Chung‐Yu Wu, Hun-Hsien Chang, Shih‐Hung Chen, Li-Wei Chu, Po‐Tsun Liu, Hao Tang, Shih-Wei Sun, Shih‐Lun Chen and Chun‐Yu Lin. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability, IEEE Journal of Solid-State Circuits, IEEE Electron Device Letters and Japanese Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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