Mark P. Baze
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
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- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Advanced Memory and Neural Computing
Papers in
-
- VLSI and Analog Circuit Testing 9
- Physical Unclonable Functions (PUFs) and Hardware Security 2
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- Radiation Effects in Electronics 20
- Integrated Circuits and Semiconductor Failure Analysis 19
- Semiconductor materials and devices 18
- Electrostatic Discharge in Electronics 8
- Advancements in Semiconductor Devices and Circuit Design 6
- Low-power high-performance VLSI design 6
- Co-authors
- Stephen P Buchner (7 shared papers)Dale McMorrow (7 shared papers)A.H. Johnston (9 shared papers)Lloyd W. Massengill (8 shared papers)Oluwole A. Amusan (8 shared papers)Bharat L. Bhuva (7 shared papers)Joseph S. Melinger (3 shared papers)David Joseph Brown (1 shared paper)
- Journals
- IEEE Transactions on Nuclear Science (23 papers)IEEE Transactions on Device and Materials Reliability (2 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)NASA STI Repository (National Aeronautics and Space Administration) (1 paper)
- Partner nations
- United StatesFranceCanada
In The Last Decade
Mark P. Baze
32 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 39
- Hardware and Architecture 704
- Electrical and Electronic Engineering 1.3k
- Radiation 46
- Safety, Risk, Reliability and Quality 38
- Nuclear and High Energy Physics 35
Countries citing papers authored by Mark P. Baze
This map shows the geographic impact of Mark P. Baze's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mark P. Baze with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mark P. Baze more than expected).
Fields of papers citing papers by Mark P. Baze
This network shows the impact of papers produced by Mark P. Baze. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mark P. Baze. The network helps show where Mark P. Baze may publish in the future.
Co-authors
The 25 scholars most cited alongside Mark P. Baze, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 32 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 196 | |
| 2 | 1997 | 136 | |
| 3 | 2000 | 102 | |
| 4 | 2005 | 99 | |
| 5 | 2008 | 94 | |
| 6 | 2007 | 84 | |
| 7 | 2007 | 70 | |
| 8 | 1991 | 67 | |
| 9 | 2009 | 62 | |
| 10 | 2006 | 56 | |
| 11 | 2007 | 49 | |
| 12 | 2008 | 44 | |
| 13 | 2008 | 43 | |
| 14 | 2006 | 39 | |
| 15 | 2009 | 36 | |
| 16 | 1985 | 25 | |
| 17 | 2008 | 23 | |
| 18 | 1985 | 23 | |
| 19 | 1995 | 23 | |
| 20 | 1990 | 17 |
About Mark P. Baze
Mark P. Baze is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Ceramics and Composites, Computational Mechanics and Aerospace Engineering, having authored 32 papers that have together received 1.4k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (20 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers), Semiconductor materials and devices (18 papers), VLSI and Analog Circuit Testing (9 papers), Electrostatic Discharge in Electronics (8 papers), Advancements in Semiconductor Devices and Circuit Design (6 papers), Low-power high-performance VLSI design (6 papers) and Physical Unclonable Functions (PUFs) and Hardware Security (2 papers). The work is most often cited by research in Hardware and Architecture (704 citations), Electrical and Electronic Engineering (1.3k citations), Radiation (46 citations), Safety, Risk, Reliability and Quality (38 citations) and Nuclear and High Energy Physics (35 citations). Mark P. Baze has collaborated with scholars based in United States, France and Canada. Frequent co-authors include Stephen P Buchner, Dale McMorrow, A.H. Johnston, Lloyd W. Massengill, Oluwole A. Amusan, Bharat L. Bhuva, Joseph S. Melinger, David Joseph Brown, Jeffrey D. Black and Arthur F. Witulski. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and NASA STI Repository (National Aeronautics and Space Administration).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.