M. P. Murrell
Impact in
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- Force Microscopy Techniques and Applications
- Surface and Thin Film Phenomena
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 9
- Semiconductor materials and devices 5
- Plasma Diagnostics and Applications 2
- Silicon Carbide Semiconductor Technologies 1
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- Ion-surface interactions and analysis 5
- Co-authors
- Mark E. Welland (6 shared papers)S. J. O’Shea (3 shared papers)C.J. Sofield (8 shared papers)Steven Verhaverbeke (3 shared papers)Marc Heyns (3 shared papers)J. R. Barnes (2 shared papers)Clifton Woods (1 shared paper)J. E. Draper (1 shared paper)
- Journals
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (3 papers)Applied Physics Letters (2 papers)Philosophical Magazine B (1 paper)Vacuum (1 paper)Radiation effects and defects in solids (1 paper)
- Partner nations
- United KingdomBelgiumSpain
In The Last Decade
M. P. Murrell
14 papers receiving 329 citations
Peers
Comparison fields: 5 of 33
- Atomic and Molecular Physics, and Optics 190
- Structural Biology 7
- Electrical and Electronic Engineering 229
- Computational Mechanics 62
- Electrochemistry 18
Countries citing papers authored by M. P. Murrell
This map shows the geographic impact of M. P. Murrell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. P. Murrell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. P. Murrell more than expected).
Fields of papers citing papers by M. P. Murrell
This network shows the impact of papers produced by M. P. Murrell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. P. Murrell. The network helps show where M. P. Murrell may publish in the future.
Co-authors
The 19 scholars most cited alongside M. P. Murrell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 123 | |
| 2 | 1993 | 104 | |
| 3 | 1984 | 29 | |
| 4 | 1992 | 25 | |
| 5 | 1991 | 14 | |
| 6 | 1995 | 13 | |
| 7 | 1993 | 9 | |
| 8 | 1989 | 7 | |
| 9 | 1990 | 4 | |
| 10 | 1992 | 4 | |
| 11 | 1992 | 3 | |
| 12 | 1994 | 3 | |
| 13 | 1992 | 2 | |
| 14 | 1995 | 1 |
About M. P. Murrell
M. P. Murrell is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Radiation, having authored 14 papers that have together received 341 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Ion-surface interactions and analysis (5 papers), Semiconductor materials and devices (5 papers), Force Microscopy Techniques and Applications (4 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Nuclear Physics and Applications (2 papers), Plasma Diagnostics and Applications (2 papers) and Silicon Carbide Semiconductor Technologies (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (190 citations), Structural Biology (7 citations), Electrical and Electronic Engineering (229 citations), Computational Mechanics (62 citations) and Electrochemistry (18 citations). M. P. Murrell has collaborated with scholars based in United Kingdom, Belgium and Spain. Frequent co-authors include Mark E. Welland, S. J. O’Shea, C.J. Sofield, Steven Verhaverbeke, Marc Heyns, J. R. Barnes, Clifton Woods, J. E. Draper, N. E. B. Cowern and Hans A. Biebuyck. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Physics Letters, Philosophical Magazine B, Vacuum and Radiation effects and defects in solids.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.