Karsten Tillmann
Impact in
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 22
-
- Integrated Circuits and Semiconductor Failure Analysis 5
- Advanced Semiconductor Detectors and Materials 4
- Semiconductor materials and devices 4
- Co-authors
- A. Thust (11 shared papers)K. Urban (15 shared papers)Markus Lentzen (9 shared papers)Chun‐Lin Jia (7 shared papers)András Kovács (2 shared papers)A. Förster (5 shared papers)Juri Barthel (5 shared papers)Roland Schierholz (1 shared paper)
- Journals
- Microscopy and Microanalysis (8 papers)Ultramicroscopy (4 papers)Thin Solid Films (3 papers)Journal of Materials Science (2 papers)Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences (1 paper)
- Partner nations
- GermanyUnited StatesChina
In The Last Decade
Karsten Tillmann
44 papers receiving 1.1k citations
Peers
Comparison fields: 5 of 58
- Structural Biology 274
- Surfaces, Coatings and Films 232
- Condensed Matter Physics 142
- Materials Chemistry 548
- Electronic, Optical and Magnetic Materials 183
Countries citing papers authored by Karsten Tillmann
This map shows the geographic impact of Karsten Tillmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Karsten Tillmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Karsten Tillmann more than expected).
Fields of papers citing papers by Karsten Tillmann
This network shows the impact of papers produced by Karsten Tillmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Karsten Tillmann. The network helps show where Karsten Tillmann may publish in the future.
Co-authors
The 25 scholars most cited alongside Karsten Tillmann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 44 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 181 | |
| 2 | 2016 | 121 | |
| 3 | 2009 | 80 | |
| 4 | 2016 | 66 | |
| 5 | 2016 | 57 | |
| 6 | 2000 | 50 | |
| 7 | 2000 | 49 | |
| 8 | 2016 | 39 | |
| 9 | 2004 | 39 | |
| 10 | Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images | 1997 | 38 |
| 11 | 2015 | 37 | |
| 12 | 1996 | 35 | |
| 13 | 1995 | 29 | |
| 14 | 2009 | 27 | |
| 15 | 2006 | 26 | |
| 16 | 2016 | 24 | |
| 17 | 2016 | 23 | |
| 18 | 2009 | 20 | |
| 19 | 2016 | 17 | |
| 20 | 2006 | 17 |
About Karsten Tillmann
Karsten Tillmann is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Structural Biology, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 44 papers that have together received 1.1k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (22 papers), Advanced Electron Microscopy Techniques and Applications (17 papers), Semiconductor Quantum Structures and Devices (6 papers), Electronic and Structural Properties of Oxides (6 papers), Semiconductor materials and interfaces (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Advanced Semiconductor Detectors and Materials (4 papers) and Semiconductor materials and devices (4 papers). The work is most often cited by research in Structural Biology (274 citations), Surfaces, Coatings and Films (232 citations), Condensed Matter Physics (142 citations), Materials Chemistry (548 citations) and Electronic, Optical and Magnetic Materials (183 citations). Karsten Tillmann has collaborated with scholars based in Germany, United States and China. Frequent co-authors include A. Thust, K. Urban, Markus Lentzen, Chun‐Lin Jia, András Kovács, A. Förster, Juri Barthel, Roland Schierholz, Lothar Houben and M. Luysberg. Their work appears in journals such as Microscopy and Microanalysis, Ultramicroscopy, Thin Solid Films, Journal of Materials Science and Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.