M. Anderle
Impact in
- Spectroscopy top 2%
- Advanced Proteomics Techniques and Applications
- Mass Spectrometry Techniques and Applications
-
- Copper Interconnects and Reliability
Papers in
-
- Metal and Thin Film Mechanics 20
-
- Semiconductor materials and devices 31
- Plasma Diagnostics and Applications 8
- Integrated Circuits and Semiconductor Failure Analysis 6
- Silicon and Solar Cell Technologies 5
- Co-authors
- Christopher H. Becker (4 shared papers)Hua Lin (4 shared papers)Sushmita Mimi Roy (3 shared papers)Nadhira Bensaada Laidani (21 shared papers)Weixun Wang (2 shared papers)Praveen Kumar (1 shared paper)Scott M. Norton (1 shared paper)Haihong Zhou (1 shared paper)
- Journals
- Applied Surface Science (8 papers)Diamond and Related Materials (8 papers)Thin Solid Films (4 papers)Surface and Coatings Technology (3 papers)Surface and Interface Analysis (3 papers)
- Partner nations
- ItalyUnited StatesFrance
In The Last Decade
M. Anderle
71 papers receiving 1.8k citations
Peers
Comparison fields: 5 of 133
- Spectroscopy 517
- Electronic, Optical and Magnetic Materials 242
- Mechanics of Materials 301
- Electrical and Electronic Engineering 665
- Materials Chemistry 531
Countries citing papers authored by M. Anderle
This map shows the geographic impact of M. Anderle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Anderle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Anderle more than expected).
Fields of papers citing papers by M. Anderle
This network shows the impact of papers produced by M. Anderle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Anderle. The network helps show where M. Anderle may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Anderle, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 73 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 544 | |
| 2 | 2004 | 104 | |
| 3 | 2007 | 80 | |
| 4 | 2006 | 79 | |
| 5 | 2007 | 66 | |
| 6 | 2009 | 63 | |
| 7 | 2006 | 61 | |
| 8 | 2006 | 56 | |
| 9 | 1987 | 47 | |
| 10 | 1999 | 46 | |
| 11 | 2000 | 45 | |
| 12 | 2006 | 41 | |
| 13 | 1995 | 40 | |
| 14 | 2004 | 37 | |
| 15 | 2004 | 33 | |
| 16 | 2004 | 32 | |
| 17 | 2004 | 31 | |
| 18 | 1997 | 28 | |
| 19 | 2007 | 26 | |
| 20 | 2004 | 24 |
About M. Anderle
M. Anderle is a scholar working on Mechanics of Materials, Electrical and Electronic Engineering, Materials Chemistry, Computational Mechanics and Electronic, Optical and Magnetic Materials, having authored 73 papers that have together received 1.9k indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Diamond and Carbon-based Materials Research (23 papers), Metal and Thin Film Mechanics (20 papers), Ion-surface interactions and analysis (15 papers), Copper Interconnects and Reliability (13 papers), Plasma Diagnostics and Applications (8 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Silicon and Solar Cell Technologies (5 papers). The work is most often cited by research in Spectroscopy (517 citations), Electronic, Optical and Magnetic Materials (242 citations), Mechanics of Materials (301 citations), Electrical and Electronic Engineering (665 citations) and Materials Chemistry (531 citations). M. Anderle has collaborated with scholars based in Italy, United States and France. Frequent co-authors include Christopher H. Becker, Hua Lin, Sushmita Mimi Roy, Nadhira Bensaada Laidani, Weixun Wang, Praveen Kumar, Scott M. Norton, Haihong Zhou, Thomas A. Shaler and Paolo Lazzeri. Their work appears in journals such as Applied Surface Science, Diamond and Related Materials, Thin Solid Films, Surface and Coatings Technology and Surface and Interface Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.