Li-C. Wang
Impact in
- Hardware and Architecture top 0.2%
- VLSI and Analog Circuit Testing
- Software top 1%
- Software Testing and Debugging Techniques
Papers in
-
- VLSI and Analog Circuit Testing 123
-
- Integrated Circuits and Semiconductor Failure Analysis 65
- Low-power high-performance VLSI design 45
- VLSI and FPGA Design Techniques 41
- Radiation Effects in Electronics 14
- Co-authors
- Kwang‐Ting Cheng (54 shared papers)Magdy S. Abadir (52 shared papers)Jing-Jia Liou (12 shared papers)A. Krstić (9 shared papers)Feng Lu (5 shared papers)Angela Krstić (5 shared papers)Yuan‐Yih Hsu (3 shared papers)Kai Yang (4 shared papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (5 papers)IEEE Design and Test (4 papers)Vaccine (2 papers)Eksploatacja i Niezawodnosc - Maintenance and Reliability (1 paper)IEEE Transactions on Energy Conversion (1 paper)
- Partner nations
- United StatesTaiwanGermany
In The Last Decade
Li-C. Wang
203 papers receiving 3.1k citations
Peers
Comparison fields: 5 of 122
- Hardware and Architecture 2.2k
- Software 414
- Electrical and Electronic Engineering 2.2k
- Industrial and Manufacturing Engineering 288
- Computational Theory and Mathematics 378
Countries citing papers authored by Li-C. Wang
This map shows the geographic impact of Li-C. Wang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Li-C. Wang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Li-C. Wang more than expected).
Fields of papers citing papers by Li-C. Wang
This network shows the impact of papers produced by Li-C. Wang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Li-C. Wang. The network helps show where Li-C. Wang may publish in the future.
Co-authors
The 25 scholars most cited alongside Li-C. Wang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 219 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 123 | |
| 2 | 2008 | 88 | |
| 3 | 2004 | 86 | |
| 4 | 2003 | 82 | |
| 5 | 2003 | 79 | |
| 6 | 2008 | 67 | |
| 7 | 2017 | 65 | |
| 8 | 2006 | 58 | |
| 9 | 2004 | 57 | |
| 10 | 2004 | 55 | |
| 11 | 2009 | 53 | |
| 12 | 2008 | 49 | |
| 13 | 1988 | 48 | |
| 14 | 2001 | 48 | |
| 15 | 2004 | 47 | |
| 16 | 2003 | 47 | |
| 17 | 2003 | 47 | |
| 18 | 2004 | 46 | |
| 19 | 2016 | 44 | |
| 20 | 2008 | 41 |
About Li-C. Wang
Li-C. Wang is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Software, Computational Theory and Mathematics and Artificial Intelligence, having authored 219 papers that have together received 3.3k indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (123 papers), Integrated Circuits and Semiconductor Failure Analysis (65 papers), Low-power high-performance VLSI design (45 papers), VLSI and FPGA Design Techniques (41 papers), Software Testing and Debugging Techniques (36 papers), Formal Methods in Verification (33 papers), Industrial Vision Systems and Defect Detection (25 papers) and Radiation Effects in Electronics (14 papers). The work is most often cited by research in Hardware and Architecture (2.2k citations), Software (414 citations), Electrical and Electronic Engineering (2.2k citations), Industrial and Manufacturing Engineering (288 citations) and Computational Theory and Mathematics (378 citations). Li-C. Wang has collaborated with scholars based in United States, Taiwan and Germany. Frequent co-authors include Kwang‐Ting Cheng, Magdy S. Abadir, Jing-Jia Liou, A. Krstić, Feng Lu, Angela Krstić, Yuan‐Yih Hsu, Kai Yang, Terrence Mak and M.R. Mercer. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Design and Test, Vaccine, Eksploatacja i Niezawodnosc - Maintenance and Reliability and IEEE Transactions on Energy Conversion.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.