IEEE Design and Test

7.0k citations
684 papers · · active since 1950

Impact in

    • Physical Unclonable Functions (PUFs) and Hardware Security
    • Parallel Computing and Optimization Techniques
    • VLSI and Analog Circuit Testing
    • Advanced Memory and Neural Computing
    • Integrated Circuits and Semiconductor Failure Analysis
    • Low-power high-performance VLSI design
    • Ferroelectric and Negative Capacitance Devices
    • Radiation Effects in Electronics

Papers in

    • VLSI and Analog Circuit Testing 127
    • Physical Unclonable Functions (PUFs) and Hardware Security 89
    • Parallel Computing and Optimization Techniques 70
    • Embedded Systems Design Techniques 61
    • Integrated Circuits and Semiconductor Failure Analysis 98
    • Advanced Memory and Neural Computing 94
    • Radiation Effects in Electronics 56
    • Semiconductor materials and devices 56

IEEE Design and Test

581 papers receiving 6.7k citations

Peers

IEEE Design and Test
Comparison fields: 5 of 129
  • Hardware and Architecture 2.8k
  • Electrical and Electronic Engineering 4.5k
  • Computer Networks and Communications 1.5k
  • Artificial Intelligence 1.3k
  • Signal Processing 441
Replace IEEE Embedded Systems Letters with:
IEEE Embedded Systems Letters United States
ACM Transactions on Reconfigurable Technology and Systems United States
IET Computers & Digital Techniques United States
ACM Journal on Emerging Technologies in Computing Systems United States
IEEE Circuits and Devices Magazine United States
IEEE Computer Architecture Letters United States
VLSI design United States
IEEE Transactions on Emerging Topics in Computing United States
ACM Transactions on Architecture and Code Optimization United States
IEEE Journal on Emerging and Selected Topics in Circuits and Systems United States
IEEE Design and Test relative to IEEE Embedded Systems Letters United States IEEE Embedded Systems Letters's profile →
Citations per field
00.5×1.5×1.8×
IEEE Embedded Systems Letters · 1×
Citations per year

Countries where authors publish in IEEE Design and Test

Since Specialization
Citations

This map shows the geographic impact of research published in IEEE Design and Test. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in IEEE Design and Test with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites IEEE Design and Test more than expected).

Fields of papers published in IEEE Design and Test

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in IEEE Design and Test. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in IEEE Design and Test.

About IEEE Design and Test

The 684 papers published in IEEE Design and Test in the last decades have received a total of 7.0k indexed citations . Papers published in IEEE Design and Test usually cover Hardware and Architecture (294 papers), Electrical and Electronic Engineering (404 papers), Computer Networks and Communications (124 papers), Artificial Intelligence (134 papers) and Signal Processing (43 papers) specifically the topics of VLSI and Analog Circuit Testing (127 papers), Integrated Circuits and Semiconductor Failure Analysis (98 papers), Advanced Memory and Neural Computing (94 papers), Physical Unclonable Functions (PUFs) and Hardware Security (89 papers), Parallel Computing and Optimization Techniques (70 papers), Embedded Systems Design Techniques (61 papers), Radiation Effects in Electronics (56 papers) and Semiconductor materials and devices (56 papers). The most active scholars publishing in IEEE Design and Test are Eric Beyne, Nam Sung Kim, Qiang Xu, Todd Mytkowicz, Mohammad Tehranipoor, Debdeep Mukhopadhyay, Sudeep Pasricha, Sandip Ray, Michail Maniatakos and Charlie Miller.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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