Lancy Tsung
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electronic Packaging and Soldering Technologies
- Ferroelectric and Negative Capacitance Devices
Papers in
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- Semiconductor materials and devices 6
- Silicon and Solar Cell Technologies 3
- Integrated Circuits and Semiconductor Failure Analysis 3
- Ferroelectric and Negative Capacitance Devices 1
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- Semiconductor materials and interfaces 5
- Co-authors
- M. J. Bevan (3 shared papers)Luigi Colombo (3 shared papers)J. W. McPherson (2 shared papers)Jeffrey T. Roberts (2 shared papers)Stephen A. Campbell (2 shared papers)Wayne L. Gladfelter (2 shared papers)Ryan C. Smith (2 shared papers)E.T. Ogawa (1 shared paper)
- Journals
- Microscopy and Microanalysis (4 papers)The Journal of Physical Chemistry (1 paper)Ultramicroscopy (1 paper)Journal of materials research/Pratt's guide to venture capital sources (1 paper)Microelectronics Reliability (1 paper)
- Partner nations
- United StatesFinlandUnited Kingdom
In The Last Decade
Lancy Tsung
13 papers receiving 400 citations
Peers
Comparison fields: 5 of 63
- Electronic, Optical and Magnetic Materials 118
- Electrical and Electronic Engineering 288
- Hematology 35
- Structural Biology 4
- Materials Chemistry 125
Countries citing papers authored by Lancy Tsung
This map shows the geographic impact of Lancy Tsung's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Lancy Tsung with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Lancy Tsung more than expected).
Fields of papers citing papers by Lancy Tsung
This network shows the impact of papers produced by Lancy Tsung. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Lancy Tsung. The network helps show where Lancy Tsung may publish in the future.
Co-authors
The 25 scholars most cited alongside Lancy Tsung, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2000 | 123 | |
| 2 | 2003 | 109 | |
| 3 | 1993 | 46 | |
| 4 | 2003 | 39 | |
| 5 | 1995 | 33 | |
| 6 | 1995 | 28 | |
| 7 | 2003 | 26 | |
| 8 | 1993 | 5 | |
| 9 | 2000 | 4 | |
| 10 | 2000 | 3 | |
| 11 | 2008 | 2 | |
| 12 | 2005 | 2 | |
| 13 | 2003 | 1 | |
| 14 | 1997 | 0 |
About Lancy Tsung
Lancy Tsung is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Structural Biology, Surfaces, Coatings and Films and Materials Chemistry, having authored 14 papers that have together received 421 indexed citations. Recurring topics across this work include Semiconductor materials and devices (6 papers), Semiconductor materials and interfaces (5 papers), Silicon and Solar Cell Technologies (3 papers), Advanced Electron Microscopy Techniques and Applications (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Metal and Thin Film Mechanics (2 papers) and Ferroelectric and Negative Capacitance Devices (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (118 citations), Electrical and Electronic Engineering (288 citations), Hematology (35 citations), Structural Biology (4 citations) and Materials Chemistry (125 citations). Lancy Tsung has collaborated with scholars based in United States, Finland and United Kingdom. Frequent co-authors include M. J. Bevan, Luigi Colombo, J. W. McPherson, Jeffrey T. Roberts, Stephen A. Campbell, Wayne L. Gladfelter, Ryan C. Smith, E.T. Ogawa, Tz-Cheng Chiu and Zhu Zhu. Their work appears in journals such as Microscopy and Microanalysis, The Journal of Physical Chemistry, Ultramicroscopy, Journal of materials research/Pratt's guide to venture capital sources and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.