J.S. Cable
Impact in
- Radiation top 10%
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in
-
- Semiconductor materials and devices 17
- Advancements in Semiconductor Devices and Circuit Design 14
- Integrated Circuits and Semiconductor Failure Analysis 10
- Radiation Effects in Electronics 4
- Advanced Memory and Neural Computing 3
- Ferroelectric and Negative Capacitance Devices 2
- Electrostatic Discharge in Electronics 2
-
- VLSI and Analog Circuit Testing 3
- Co-authors
- L. R. Canfield (1 shared paper)R. Korde (1 shared paper)J.C.S. Woo (7 shared papers)Yu Song (3 shared papers)R Märtin (2 shared papers)Nasr M. Ghoniem (2 shared papers)C.G. Hwang (1 shared paper)S. Gowda (2 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (8 papers)IEEE Transactions on Electron Devices (3 papers)IEEE Electron Device Letters (3 papers)IEEE Journal of Solid-State Circuits (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)
- Partner nations
- United StatesSouth Korea
In The Last Decade
J.S. Cable
19 papers receiving 312 citations
Peers
Comparison fields: 5 of 38
- Radiation 42
- Hardware and Architecture 32
- Electrical and Electronic Engineering 266
- Instrumentation 10
- Nuclear and High Energy Physics 30
Countries citing papers authored by J.S. Cable
This map shows the geographic impact of J.S. Cable's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.S. Cable with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.S. Cable more than expected).
Fields of papers citing papers by J.S. Cable
This network shows the impact of papers produced by J.S. Cable. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.S. Cable. The network helps show where J.S. Cable may publish in the future.
Co-authors
The 19 scholars most cited alongside J.S. Cable, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1993 | 86 | |
| 2 | 1987 | 51 | |
| 3 | 1991 | 36 | |
| 4 | 1988 | 36 | |
| 5 | 1993 | 31 | |
| 6 | 1992 | 19 | |
| 7 | 1995 | 13 | |
| 8 | 1991 | 10 | |
| 9 | 1986 | 9 | |
| 10 | 1991 | 9 | |
| 11 | 1992 | 9 | |
| 12 | 1993 | 7 | |
| 13 | 1987 | 5 | |
| 14 | 1991 | 4 | |
| 15 | 1986 | 3 | |
| 16 | 1986 | 2 | |
| 17 | 2002 | 2 | |
| 18 | Bias and Temperature Dependence of Hot Carrier Lifetime from 77K to 300K | 1992 | 1 |
| 19 | 2002 | 1 | |
| 20 | 2002 | 0 |
About J.S. Cable
J.S. Cable is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Nuclear and High Energy Physics and Materials Chemistry, having authored 21 papers that have together received 334 indexed citations. Recurring topics across this work include Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Radiation Effects in Electronics (4 papers), VLSI and Analog Circuit Testing (3 papers), Advanced Memory and Neural Computing (3 papers), Ferroelectric and Negative Capacitance Devices (2 papers) and Electrostatic Discharge in Electronics (2 papers). The work is most often cited by research in Radiation (42 citations), Hardware and Architecture (32 citations), Electrical and Electronic Engineering (266 citations), Instrumentation (10 citations) and Nuclear and High Energy Physics (30 citations). J.S. Cable has collaborated with scholars based in United States and South Korea. Frequent co-authors include L. R. Canfield, R. Korde, J.C.S. Woo, Yu Song, R Märtin, Nasr M. Ghoniem, C.G. Hwang, S. Gowda, B.J. Sheu and Jinyoung Choi. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Journal of Solid-State Circuits and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.