J. Wyss

17.0k citations

88 papers · 863 · h-index 13

Impact in

Radiation top 5%
- Radiation Detection and Scintillator Technologies
Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing

Papers in

Electrical and Electronic Engineering 72
- Radiation Effects in Electronics 49
- Integrated Circuits and Semiconductor Failure Analysis 28
- Semiconductor materials and devices 26
- Advancements in Semiconductor Devices and Circuit Design 17
Radiation 27
- Radiation Detection and Scintillator Technologies 20
- Nuclear Physics and Applications 13

Co-authors: D. Bisello (43 shared papers)D. Pantano (31 shared papers)A. Paccagnella (14 shared papers)A. Candelori (35 shared papers)G. Ghidini (6 shared papers)M. Ceschia (5 shared papers)G. Busatto (9 shared papers)F. Velardi (6 shared papers)
Journals: IEEE Transactions on Nuclear Science (18 papers)Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment (14 papers)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (8 papers)Microelectronics Reliability (5 papers)IEEE Transactions on Electron Devices (2 papers)
Partner nations: Italy United States United Kingdom

In The Last Decade

J. Wyss

79 papers receiving 828 citations

Peers

Countries citing papers authored by J. Wyss

Since Specialization

Citations

This map shows the geographic impact of J. Wyss's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Wyss with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Wyss more than expected).

Fields of papers citing papers by J. Wyss

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Wyss. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Wyss. The network helps show where J. Wyss may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Wyss, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Wyss Line = papers co-authored together J. Wyss links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 88 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	SIRAD: an irradiation facility at the LNL Tandem accelerator for radiation damage studies on semiconductor detectors and electronic devices and systems Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·J. Wyss, D. Bisello, D. Pantano	2001	104
2	Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation—Part I IEEE Transactions on Electron Devices ·C. Abbate, G. Busatto, D. Tedesco, A. Sanseverino, L. Silvestrin, F. Velardi, J. Wyss	2019	66
3	Radiation effects on floating-gate memory cells IEEE Transactions on Nuclear Science ·G. Cellere, P. Pellati, A. Chimenton, J. Wyss, Alberto Modelli, Luca Larcher, A. Paccagnella	2001	66
4	Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electron or X-ray irradiation IEEE Transactions on Nuclear Science ·M. Ceschia, A. Paccagnella, Simone Sandrin, G. Ghidini, J. Wyss, M. Lavale, O. Flament	2000	61
5	Heavy ion irradiation of thin gate oxides IEEE Transactions on Nuclear Science ·M. Ceschia, A. Paccagnella, Mauro Turrini, A. Candelori, G. Ghidini, J. Wyss	2000	51
6	Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation—Part II IEEE Transactions on Electron Devices ·C. Abbate, G. Busatto, D. Tedesco, A. Sanseverino, F. Velardi, J. Wyss	2019	49
7	Anomalous charge loss from floating-gate memory cells due to heavy ions irradiation IEEE Transactions on Nuclear Science ·G. Cellere, A. Paccagnella, Luca Larcher, A. Chimenton, J. Wyss, A. Candelori, Alberto Modelli	2002	42
8	Accelerated wear-out of ultra-thin gate oxides after irradiation IEEE Transactions on Nuclear Science ·Andrea Cester, S. Cimino, A. Paccagnella, G. Ghibaudo, G. Ghidini, J. Wyss	2003	39
9	Radiation hardness of silicon detectors for high-energy physics applications IEEE Transactions on Nuclear Science ·A. Candelori, D. Bisello, R. Rando, A. Kaminski, J. Wyss, A. Litovchenko, G.‐F. Dalla Betta, M. Lozano, M. Boscardin, C. Martı́nez, M. Ullán, N. Zorzi	2003	21
10	Ion beam testing of SRAM-based FPGA's M. Bellato, M. Ceschia, M. Menichelli, A. Papi, J. Wyss, A. Paccagnella	2005	20
11	Effects of proton irradiation on glass filter substrates for the Rosetta mission Applied Optics ·G. Naletto, Alessio Boscolo, J. Wyss, A. Quaranta	2003	19
12	A practical optical modulator and link for antennas Journal of Lightwave Technology ·J. Wyss, S. Sheeran	1985	18
13	Thin oxide degradation after high-energy ion irradiation IEEE Transactions on Nuclear Science ·A. Candelori, M. Ceschia, A. Paccagnella, J. Wyss, D. Bisello, G. Ghidini	2001	17
14	From Radiation Induced Leakage Current to Soft Breakdown in Irradiated MOS Devices With Ultrathin Gate Oxide MRS Proceedings ·M. Ceschia, A. Paccagnella, Andrea Cester, G. Ghidini, J. Wyss	1999	12
15	Radiation damage of standard and oxygenated silicon diodes irradiated by 16-MeV and 27-MeV protons IEEE Transactions on Nuclear Science ·D. Bisello, J. Wyss, A. Candelori, A. Kaminsky, D. Pantano	2001	12
16	Radiation testing of GLAST LAT tracker ASICs IEEE Transactions on Nuclear Science ·R. Rando, A. Bangert, D. Bisello, A. Candelori, P. Giubilato, M. Hirayama, R. P. Johnson, H. F-W. Sadrozinski, M. Sugizaki, J. Wyss, M. Ziegler	2004	11
17	Observation of an energy dependence of the radiation damage on standard and oxygenated silicon diodes by 16, 21, and 27 MeV protons Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·J. Wyss, D. Bisello, A. Candelori, A. Kaminsky, D. Pantano	2001	11
18	Lithium ion irradiation effects on epitaxial silicon detectors IEEE Transactions on Nuclear Science ·A. Candelori, Andreas Schramm, D. Bisello, Devis Contarato, E. Fretwurst, G. Lindström, R. Rando, J. Wyss	2004	10
19	Low- and high-energy proton irradiations of standard and oxygenated silicon diodes IEEE Transactions on Nuclear Science ·A. Candelori, R. Rando, D. Bisello, N. Bacchetta, A. Kaminski, D. Pantano, I. Stavitski, J. Wyss	2001	10
20	Ion electron emission microscopy at the SIRAD single event effect facility Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·D. Bisello, A. Kaminsky, A. Magalini, M. Nigro, D. Pantano, S. Sedykh, J. Wyss	2001	10

About J. Wyss

J. Wyss is a scholar working on Electrical and Electronic Engineering, Radiation, Nuclear and High Energy Physics, Computational Mechanics and Hardware and Architecture, having authored 88 papers that have together received 863 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (49 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Semiconductor materials and devices (26 papers), Particle Detector Development and Performance (23 papers), Radiation Detection and Scintillator Technologies (20 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Nuclear Physics and Applications (13 papers) and Ion-surface interactions and analysis (11 papers). The work is most often cited by research in Radiation (136 citations), Electrical and Electronic Engineering (770 citations), Nuclear and High Energy Physics (164 citations), Hardware and Architecture (39 citations) and Computational Mechanics (117 citations). J. Wyss has collaborated with scholars based in Italy, United States and United Kingdom. Frequent co-authors include D. Bisello, D. Pantano, A. Paccagnella, A. Candelori, G. Ghidini, M. Ceschia, G. Busatto, F. Velardi, A. Sanseverino and C. Abbate. Their work appears in journals such as IEEE Transactions on Nuclear Science, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Microelectronics Reliability and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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