John E. Ayers

3.1k citations
120 papers · 2.6k · 2 hit papers · h-index 18

Impact in

Papers in

John E. Ayers

111 papers receiving 2.4k citations

John E. Ayers's Hit Papers

Digital Integrated Circuits 2003 · 760 citations
7600+10+21Years since publication250500750

Peers

John E. Ayers
Comparison fields: 5 of 101
  • Hardware and Architecture 234
  • Atomic and Molecular Physics, and Optics 961
  • Electrical and Electronic Engineering 1.7k
  • Condensed Matter Physics 268
  • Materials Chemistry 648
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Chenming Hu United States
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Citations per field
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Citations per year

Countries citing papers authored by John E. Ayers

Since Specialization
Citations

This map shows the geographic impact of John E. Ayers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John E. Ayers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John E. Ayers more than expected).

Fields of papers citing papers by John E. Ayers

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John E. Ayers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John E. Ayers. The network helps show where John E. Ayers may publish in the future.

Co-authors

The 25 scholars most cited alongside John E. Ayers, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John E. Ayers Line = papers co-authored together John E. Ayers links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 120 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Digital Integrated Circuits
Hit paper breakdown →
2003760
2
The measurement of threading dislocation densities in semiconductor crystals by X-ray diffraction
Hit paper breakdown →
1994416
3 1991168
4
Heteroepitaxy of Semiconductors: Theory, Growth, and Characterization
2007136
5 2007130
6 196445
7 199544
8 199243
9 196239
10 201638
11 200936
12 198836
13 199530
14 200830
15 199028
16 200828
17 198818
18 199618
19 198017
20 199816

About John E. Ayers

John E. Ayers is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Condensed Matter Physics and Surfaces, Coatings and Films, having authored 120 papers that have together received 2.6k indexed citations. Recurring topics across this work include Semiconductor Quantum Structures and Devices (47 papers), Chalcogenide Semiconductor Thin Films (26 papers), Advanced Semiconductor Detectors and Materials (25 papers), Semiconductor materials and interfaces (24 papers), Quantum Dots Synthesis And Properties (20 papers), Semiconductor materials and devices (19 papers), Electron and X-Ray Spectroscopy Techniques (9 papers) and GaN-based semiconductor devices and materials (8 papers). The work is most often cited by research in Hardware and Architecture (234 citations), Atomic and Molecular Physics, and Optics (961 citations), Electrical and Electronic Engineering (1.7k citations), Condensed Matter Physics (268 citations) and Materials Chemistry (648 citations). John E. Ayers has collaborated with scholars based in United States, United Kingdom and Saudi Arabia. Frequent co-authors include S. K. Ghandhi, L. J. Schowalter, F. Jain, E. Suarez, T. Swain, David Parent, J. C. Hughes, A. Rodrı́guez, Michael J. Fishwick and Derek G. Land. Their work appears in journals such as Journal of Electronic Materials, Journal of Crystal Growth, Applied Physics Letters, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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