J. Otto
Impact in
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- Optical Imaging and Spectroscopy Techniques
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 8
- Semiconductor materials and devices 4
- Advancements in Photolithography Techniques 3
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- Electron and X-Ray Spectroscopy Techniques 7
- Co-authors
- J. Kölzer (9 shared papers)G. Mitić (5 shared papers)Wolfgang Zinth (5 shared papers)Erich Plies (6 shared papers)G. Sölkner (2 shared papers)Christian Boit (2 shared papers)Gerald Deboy (2 shared papers)Dietmar Weinmann (2 shared papers)
- Journals
- IBM Journal of Research and Development (1 paper)Quality and Reliability Engineering International (1 paper)Microelectronic Engineering (1 paper)Journal of Applied Physics (1 paper)Microelectronics Reliability (1 paper)
- Partner nations
- GermanyUnited States
In The Last Decade
J. Otto
20 papers receiving 348 citations
Peers
Comparison fields: 5 of 40
- Radiology, Nuclear Medicine and Imaging 136
- Surfaces, Coatings and Films 44
- Acoustics and Ultrasonics 5
- Biophysics 26
- Biomedical Engineering 188
Countries citing papers authored by J. Otto
This map shows the geographic impact of J. Otto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Otto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Otto more than expected).
Fields of papers citing papers by J. Otto
This network shows the impact of papers produced by J. Otto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Otto. The network helps show where J. Otto may publish in the future.
Co-authors
The 20 scholars most cited alongside J. Otto, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1994 | 111 | |
| 2 | 1992 | 78 | |
| 3 | 2001 | 67 | |
| 4 | 1978 | 18 | |
| 5 | 1995 | 16 | |
| 6 | 1998 | 12 | |
| 7 | 1990 | 12 | |
| 8 | 1990 | 11 | |
| 9 | 1991 | 10 | |
| 10 | 1995 | 8 | |
| 11 | 1989 | 6 | |
| 12 | 1995 | 6 | |
| 13 | 1994 | 5 | |
| 14 | 1992 | 4 | |
| 15 | 2022 | 4 | |
| 16 | 1998 | 3 | |
| 17 | 2024 | 2 | |
| 18 | 1990 | 1 | |
| 19 | 1994 | 1 | |
| 20 | On-wafer failure analysis of LSI-MOS memory circuits by scanning electron microscopy | 1977 | 1 |
About J. Otto
J. Otto is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Radiology, Nuclear Medicine and Imaging, Biomedical Engineering and Atomic and Molecular Physics, and Optics, having authored 21 papers that have together received 376 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (8 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Optical Imaging and Spectroscopy Techniques (6 papers), Photoacoustic and Ultrasonic Imaging (4 papers), Semiconductor materials and devices (4 papers), Force Microscopy Techniques and Applications (3 papers), Advancements in Photolithography Techniques (3 papers) and Infrared Thermography in Medicine (3 papers). The work is most often cited by research in Radiology, Nuclear Medicine and Imaging (136 citations), Surfaces, Coatings and Films (44 citations), Acoustics and Ultrasonics (5 citations), Biophysics (26 citations) and Biomedical Engineering (188 citations). J. Otto has collaborated with scholars based in Germany and United States. Frequent co-authors include J. Kölzer, G. Mitić, Wolfgang Zinth, Erich Plies, G. Sölkner, Christian Boit, Gerald Deboy, Dietmar Weinmann, Andreas Schubert and H. Walter. Their work appears in journals such as IBM Journal of Research and Development, Quality and Reliability Engineering International, Microelectronic Engineering, Journal of Applied Physics and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.