J. Baylet
Impact in
- Instrumentation top 10%
- Advanced Optical Sensing Technologies
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- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
- Semiconductor materials and devices
Papers in
-
- Advanced Semiconductor Detectors and Materials 27
- Chalcogenide Semiconductor Thin Films 11
- CCD and CMOS Imaging Sensors 5
- Semiconductor materials and devices 4
- Plasma Diagnostics and Applications 3
-
- Semiconductor Quantum Structures and Devices 10
- Co-authors
- Gravrand Olivier (20 shared papers)Johan Rothman (10 shared papers)Jean-Paul Chamonal (17 shared papers)Pierre Castelein (16 shared papers)G. Destéfanis (12 shared papers)Gerard L. Destefanis (9 shared papers)P. Ballet (12 shared papers)Alain Million (8 shared papers)
- Journals
- Journal of Electronic Materials (13 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)Journal of Applied Physics (1 paper)Sensors (1 paper)Surface and Interface Analysis (1 paper)
- Partner nations
- France
In The Last Decade
J. Baylet
33 papers receiving 478 citations
Peers
Comparison fields: 5 of 48
- Instrumentation 85
- Electrical and Electronic Engineering 426
- Atomic and Molecular Physics, and Optics 178
- Aerospace Engineering 143
- Materials Chemistry 125
Countries citing papers authored by J. Baylet
This map shows the geographic impact of J. Baylet's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Baylet with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Baylet more than expected).
Fields of papers citing papers by J. Baylet
This network shows the impact of papers produced by J. Baylet. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Baylet. The network helps show where J. Baylet may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Baylet, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 62 | |
| 2 | 2001 | 61 | |
| 3 | 2006 | 43 | |
| 4 | 2007 | 35 | |
| 5 | 2004 | 31 | |
| 6 | 2007 | 31 | |
| 7 | 2011 | 24 | |
| 8 | 2004 | 22 | |
| 9 | 2005 | 20 | |
| 10 | 2006 | 16 | |
| 11 | 2006 | 15 | |
| 12 | 2003 | 14 | |
| 13 | 1999 | 13 | |
| 14 | 2002 | 11 | |
| 15 | 2008 | 10 | |
| 16 | 2003 | 10 | |
| 17 | 2011 | 9 | |
| 18 | 2003 | 9 | |
| 19 | 2004 | 9 | |
| 20 | 2013 | 9 |
About J. Baylet
J. Baylet is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Aerospace Engineering, Instrumentation and Materials Chemistry, having authored 33 papers that have together received 494 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (27 papers), Chalcogenide Semiconductor Thin Films (11 papers), Semiconductor Quantum Structures and Devices (10 papers), Infrared Target Detection Methodologies (7 papers), CCD and CMOS Imaging Sensors (5 papers), Semiconductor materials and devices (4 papers), Calibration and Measurement Techniques (3 papers) and Plasma Diagnostics and Applications (3 papers). The work is most often cited by research in Instrumentation (85 citations), Electrical and Electronic Engineering (426 citations), Atomic and Molecular Physics, and Optics (178 citations), Aerospace Engineering (143 citations) and Materials Chemistry (125 citations). J. Baylet has collaborated with scholars based in France. Frequent co-authors include Gravrand Olivier, Johan Rothman, Jean-Paul Chamonal, Pierre Castelein, G. Destéfanis, Gerard L. Destefanis, P. Ballet, Alain Million, M.N. Séméria and Céline Vergnaud. Their work appears in journals such as Journal of Electronic Materials, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics, Sensors and Surface and Interface Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.