P. Madejczyk
Impact in
- Instrumentation top 10%
- Advanced Optical Sensing Technologies
- Aerospace Engineering top 5%
- Infrared Target Detection Methodologies
- Calibration and Measurement Techniques
Papers in
-
- Advanced Semiconductor Detectors and Materials 62
- Chalcogenide Semiconductor Thin Films 15
-
- Infrared Target Detection Methodologies 35
- Calibration and Measurement Techniques 6
- Co-authors
- Waldemar Gawron (54 shared papers)Antoni Rogalski (40 shared papers)Piotr Martyniuk (38 shared papers)M. Kopytko (28 shared papers)J. Rutkowski (31 shared papers)J. Piotrowski (19 shared papers)A. Piotrowski (19 shared papers)Sanjay Krishna (7 shared papers)
- Journals
- Journal of Electronic Materials (6 papers)Optical Engineering (5 papers)Semiconductor Science and Technology (4 papers)Optical and Quantum Electronics (4 papers)IEEE Sensors Journal (2 papers)
- Partner nations
- PolandUnited StatesAustralia
In The Last Decade
P. Madejczyk
59 papers receiving 611 citations
Peers
Comparison fields: 5 of 40
- Instrumentation 65
- Aerospace Engineering 269
- Electrical and Electronic Engineering 597
- Atomic and Molecular Physics, and Optics 257
- Spectroscopy 83
Countries citing papers authored by P. Madejczyk
This map shows the geographic impact of P. Madejczyk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Madejczyk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Madejczyk more than expected).
Fields of papers citing papers by P. Madejczyk
This network shows the impact of papers produced by P. Madejczyk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Madejczyk. The network helps show where P. Madejczyk may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Madejczyk, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 64 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 63 | |
| 2 | 2006 | 51 | |
| 3 | 2013 | 35 | |
| 4 | 2012 | 34 | |
| 5 | MOCVD growth of Hg₁₋xCdxTe heterostructures for uncooled infrared photodetectors | 2004 | 22 |
| 6 | 2013 | 22 | |
| 7 | Growth and properties of MOCVD HgCdTe epilayers on GaAs substrates | 2005 | 20 |
| 8 | 2005 | 20 | |
| 9 | 2005 | 17 | |
| 10 | 2012 | 17 | |
| 11 | 2015 | 17 | |
| 12 | 2017 | 17 | |
| 13 | 2013 | 17 | |
| 14 | 2013 | 15 | |
| 15 | 2021 | 15 | |
| 16 | 2009 | 15 | |
| 17 | 2015 | 14 | |
| 18 | 2010 | 14 | |
| 19 | 2016 | 14 | |
| 20 | 2010 | 13 |
About P. Madejczyk
P. Madejczyk is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Atomic and Molecular Physics, and Optics, Instrumentation and Biomedical Engineering, having authored 64 papers that have together received 639 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (62 papers), Infrared Target Detection Methodologies (35 papers), Semiconductor Quantum Structures and Devices (29 papers), Chalcogenide Semiconductor Thin Films (15 papers), Advanced Optical Sensing Technologies (9 papers), Calibration and Measurement Techniques (6 papers), Spectroscopy and Laser Applications (6 papers) and Advanced X-ray and CT Imaging (5 papers). The work is most often cited by research in Instrumentation (65 citations), Aerospace Engineering (269 citations), Electrical and Electronic Engineering (597 citations), Atomic and Molecular Physics, and Optics (257 citations) and Spectroscopy (83 citations). P. Madejczyk has collaborated with scholars based in Poland, United States and Australia. Frequent co-authors include Waldemar Gawron, Antoni Rogalski, Piotr Martyniuk, M. Kopytko, J. Rutkowski, J. Piotrowski, A. Piotrowski, Sanjay Krishna, A. Kębłowski and J. Pawluczyk. Their work appears in journals such as Journal of Electronic Materials, Optical Engineering, Semiconductor Science and Technology, Optical and Quantum Electronics and IEEE Sensors Journal.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.