J. A. Silberman

1.6k citations
57 papers · 887 · h-index 18

Impact in

Papers in

J. A. Silberman

56 papers receiving 822 citations

Peers

J. A. Silberman
Comparison fields: 5 of 48
  • Hardware and Architecture 181
  • Surfaces, Coatings and Films 128
  • Structural Biology 17
  • Electrical and Electronic Engineering 649
  • Atomic and Molecular Physics, and Optics 340
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J. M. Hammer United States
J.W. Sleight United States
M. H. Woods United States
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J. Félix United States
J.M. Palau France
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Citations per field
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Citations per year

Countries citing papers authored by J. A. Silberman

Since Specialization
Citations

This map shows the geographic impact of J. A. Silberman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. A. Silberman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. A. Silberman more than expected).

Fields of papers citing papers by J. A. Silberman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. A. Silberman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. A. Silberman. The network helps show where J. A. Silberman may publish in the future.

Co-authors

The 25 scholars most cited alongside J. A. Silberman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. A. Silberman Line = papers co-authored together J. A. Silberman links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 57 papers — load more, or switch the sort, to bring in the rest.

#Work
1 198961
2 198359
3 198252
4 199844
5 198440
6 199840
7 198835
8 201234
9 200531
10 200230
11 200227
12 198526
13 200224
14 198322
15 198320
16 198219
17 198318
18 198518
19 198317
20 198917

About J. A. Silberman

J. A. Silberman is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Materials Chemistry and Surfaces, Coatings and Films, having authored 57 papers that have together received 887 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (23 papers), Low-power high-performance VLSI design (12 papers), Semiconductor materials and devices (10 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Chalcogenide Semiconductor Thin Films (8 papers), Semiconductor Quantum Structures and Devices (7 papers), Electronic and Structural Properties of Oxides (7 papers) and VLSI and Analog Circuit Testing (7 papers). The work is most often cited by research in Hardware and Architecture (181 citations), Surfaces, Coatings and Films (128 citations), Structural Biology (17 citations), Electrical and Electronic Engineering (649 citations) and Atomic and Molecular Physics, and Optics (340 citations). J. A. Silberman has collaborated with scholars based in United States, Germany and Japan. Frequent co-authors include Richard Haight, J. A. Wilson, W. E. Spicer, I. Lindau, W. E. Spicer, Per Morgen, Osamu Takahashi, A. Sher, I. Lindau and H. Peter Hofstee. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, IEEE Micro, Physical Review Letters and IEEE Journal of Solid-State Circuits.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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