G. Oversluizen
Impact in
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- Plasma Applications and Diagnostics
- Laser Applications in Dentistry and Medicine
- Condensed Matter Physics top 10%
- GaN-based semiconductor devices and materials
Papers in
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- Plasma Diagnostics and Applications 18
- Thin-Film Transistor Technologies 14
- Semiconductor materials and devices 11
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- GaN-based semiconductor devices and materials 8
- Co-authors
- T. Dekker (12 shared papers)R. Metselaar (4 shared papers)M. F. Gillies (5 shared papers)J. Schoonman (2 shared papers)M. Klein (2 shared papers)Kees Wapenaar (1 shared paper)S.T. de Zwart (4 shared papers)Tomokazu Shiga (10 shared papers)
- Journals
- Journal of the Society for Information Display (11 papers)Journal of Applied Physics (10 papers)Applied Physics Letters (3 papers)Scientific Reports (1 paper)Journal of The Electrochemical Society (1 paper)
- Partner nations
- NetherlandsJapanFinland
In The Last Decade
G. Oversluizen
47 papers receiving 695 citations
Peers
Comparison fields: 5 of 81
- Radiology, Nuclear Medicine and Imaging 195
- Condensed Matter Physics 111
- Electrical and Electronic Engineering 521
- Inorganic Chemistry 84
- Ceramics and Composites 32
Countries citing papers authored by G. Oversluizen
This map shows the geographic impact of G. Oversluizen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Oversluizen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Oversluizen more than expected).
Fields of papers citing papers by G. Oversluizen
This network shows the impact of papers produced by G. Oversluizen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Oversluizen. The network helps show where G. Oversluizen may publish in the future.
Co-authors
The 25 scholars most cited alongside G. Oversluizen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 74 | |
| 2 | 1984 | 65 | |
| 3 | 1980 | 61 | |
| 4 | 2016 | 48 | |
| 5 | 2002 | 34 | |
| 6 | 2000 | 31 | |
| 7 | 1979 | 28 | |
| 8 | 2004 | 28 | |
| 9 | 1998 | 25 | |
| 10 | 2017 | 23 | |
| 11 | 1992 | 21 | |
| 12 | 2006 | 21 | |
| 13 | 2003 | 18 | |
| 14 | 2009 | 18 | |
| 15 | 2008 | 17 | |
| 16 | 1992 | 16 | |
| 17 | 2004 | 15 | |
| 18 | 1982 | 14 | |
| 19 | 1991 | 12 | |
| 20 | 2002 | 12 |
About G. Oversluizen
G. Oversluizen is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Radiology, Nuclear Medicine and Imaging, Materials Chemistry and Polymers and Plastics, having authored 50 papers that have together received 723 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (18 papers), Thin-Film Transistor Technologies (14 papers), Semiconductor materials and devices (11 papers), GaN-based semiconductor devices and materials (8 papers), Transition Metal Oxide Nanomaterials (7 papers), Plasma Applications and Diagnostics (7 papers), Silicon Nanostructures and Photoluminescence (6 papers) and Surface Roughness and Optical Measurements (5 papers). The work is most often cited by research in Radiology, Nuclear Medicine and Imaging (195 citations), Condensed Matter Physics (111 citations), Electrical and Electronic Engineering (521 citations), Inorganic Chemistry (84 citations) and Ceramics and Composites (32 citations). G. Oversluizen has collaborated with scholars based in Netherlands, Japan and Finland. Frequent co-authors include T. Dekker, R. Metselaar, M. F. Gillies, J. Schoonman, M. Klein, Kees Wapenaar, S.T. de Zwart, Tomokazu Shiga, T.J. Vink and Anja Becker. Their work appears in journals such as Journal of the Society for Information Display, Journal of Applied Physics, Applied Physics Letters, Scientific Reports and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.