T. Dekker

514 citations
20 papers · 414 · h-index 13

Impact in

Papers in

T. Dekker

20 papers receiving 394 citations

Peers

T. Dekker
Comparison fields: 5 of 47
  • Media Technology 69
  • Condensed Matter Physics 70
  • Radiology, Nuclear Medicine and Imaging 117
  • Acoustics and Ultrasonics 5
  • Electrical and Electronic Engineering 303
Replace Thierry Leroux with:
Thierry Leroux France
Tsutae Shinoda Japan
Yong Bi China
Holger Moench Germany
T. Wakano Japan
B. Rae United Kingdom
Ł. Nieradko France
K. Inoue Japan
Y. Sugimoto Japan
T. Dekker relative to Thierry Leroux France Thierry Leroux's profile →
Citations per field
00.5×7.8×
Thierry Leroux · 1×
Citations per year

Countries citing papers authored by T. Dekker

Since Specialization
Citations

This map shows the geographic impact of T. Dekker's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Dekker with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Dekker more than expected).

Fields of papers citing papers by T. Dekker

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Dekker. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Dekker. The network helps show where T. Dekker may publish in the future.

Co-authors

The 25 scholars most cited alongside T. Dekker, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with T. Dekker Line = papers co-authored together T. Dekker links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 200274
2 200644
3 200031
4 200428
5 200525
6 200625
7 202025
8 200021
9 200621
10 200318
11 200817
12 201715
13 200212
14 200512
15 200312
16 200211
17 200110
18 20225
19 20224
20 20064

About T. Dekker

T. Dekker is a scholar working on Electrical and Electronic Engineering, Radiology, Nuclear Medicine and Imaging, Condensed Matter Physics, Polymers and Plastics and Computational Mechanics, having authored 20 papers that have together received 414 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (9 papers), Plasma Applications and Diagnostics (5 papers), GaN-based semiconductor devices and materials (4 papers), Transition Metal Oxide Nanomaterials (4 papers), Gas Sensing Nanomaterials and Sensors (4 papers), Surface Roughness and Optical Measurements (3 papers), Advancements in Photolithography Techniques (3 papers) and Semiconductor materials and devices (3 papers). The work is most often cited by research in Media Technology (69 citations), Condensed Matter Physics (70 citations), Radiology, Nuclear Medicine and Imaging (117 citations), Acoustics and Ultrasonics (5 citations) and Electrical and Electronic Engineering (303 citations). T. Dekker has collaborated with scholars based in Netherlands, Canada and Finland. Frequent co-authors include G. Oversluizen, S.T. de Zwart, M. Klein, W. L. IJzerman, M. F. Gillies, Oscar H. Willemsen, Adam W. Tsen, Xuan Luo, Yuping Sun and Junichi Okamoto. Their work appears in journals such as Journal of the Society for Information Display, Applied Physics Letters, Journal of Applied Physics, The Journal of Physical Chemistry C and Nano Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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