Fangming Ye
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Industrial Vision Systems and Defect Detection
Papers in
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- VLSI and Analog Circuit Testing 11
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- Industrial Vision Systems and Defect Detection 11
- Manufacturing Process and Optimization 5
- Co-authors
- Krishnendu Chakrabarty (35 shared papers)Xinli Gu (24 shared papers)Zhaobo Zhang (14 shared papers)Farshad Firouzi (8 shared papers)Mehdi Baradaran Tahoori (7 shared papers)Sergej Deutsch (2 shared papers)Himanshu Thapliyal (1 shared paper)Xin Li (4 shared papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (7 papers)ACM Transactions on Design Automation of Electronic Systems (2 papers)Journal of Thermal Science and Engineering Applications (1 paper)IEEE Design and Test (1 paper)Energy Science & Engineering (1 paper)
- Partner nations
- United StatesGermanyChina
In The Last Decade
Fangming Ye
39 papers receiving 650 citations
Peers
Comparison fields: 5 of 59
- Hardware and Architecture 209
- Industrial and Manufacturing Engineering 86
- Electrical and Electronic Engineering 413
- Software 30
- Control and Systems Engineering 99
Countries citing papers authored by Fangming Ye
This map shows the geographic impact of Fangming Ye's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fangming Ye with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fangming Ye more than expected).
Fields of papers citing papers by Fangming Ye
This network shows the impact of papers produced by Fangming Ye. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fangming Ye. The network helps show where Fangming Ye may publish in the future.
Co-authors
The 25 scholars most cited alongside Fangming Ye, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 90 | |
| 2 | 2013 | 83 | |
| 3 | 2012 | 55 | |
| 4 | 2014 | 50 | |
| 5 | 2015 | 37 | |
| 6 | 2013 | 34 | |
| 7 | 2015 | 30 | |
| 8 | 2013 | 27 | |
| 9 | 2014 | 26 | |
| 10 | 2012 | 24 | |
| 11 | 2015 | 21 | |
| 12 | 2015 | 19 | |
| 13 | 2014 | 16 | |
| 14 | 2019 | 15 | |
| 15 | 2020 | 15 | |
| 16 | 2014 | 14 | |
| 17 | 2018 | 11 | |
| 18 | 2018 | 10 | |
| 19 | 2012 | 10 | |
| 20 | 2015 | 10 |
About Fangming Ye
Fangming Ye is a scholar working on Hardware and Architecture, Industrial and Manufacturing Engineering, Electrical and Electronic Engineering, Control and Systems Engineering and Statistics, Probability and Uncertainty, having authored 40 papers that have together received 665 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (11 papers), Industrial Vision Systems and Defect Detection (11 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Semiconductor materials and devices (9 papers), Fault Detection and Control Systems (8 papers), Manufacturing Process and Optimization (5 papers), 3D IC and TSV technologies (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). The work is most often cited by research in Hardware and Architecture (209 citations), Industrial and Manufacturing Engineering (86 citations), Electrical and Electronic Engineering (413 citations), Software (30 citations) and Control and Systems Engineering (99 citations). Fangming Ye has collaborated with scholars based in United States, Germany and China. Frequent co-authors include Krishnendu Chakrabarty, Xinli Gu, Zhaobo Zhang, Farshad Firouzi, Mehdi Baradaran Tahoori, Sergej Deutsch, Himanshu Thapliyal, Xin Li, Mengyun Liu and Bill Eklow. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ACM Transactions on Design Automation of Electronic Systems, Journal of Thermal Science and Engineering Applications, IEEE Design and Test and Energy Science & Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.