Fangming Ye
Impact in
- Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
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- Industrial Vision Systems and Defect Detection
Papers in
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- Semiconductor materials and devices 9
- Integrated Circuits and Semiconductor Failure Analysis 9
- 3D IC and TSV technologies 4
- Advancements in Semiconductor Devices and Circuit Design 4
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- VLSI and Analog Circuit Testing 11
- Co-authors
- Krishnendu Chakrabarty (28 shared papers)Xinli Gu (17 shared papers)Zhaobo Zhang (11 shared papers)Mehdi B. Tahoori (7 shared papers)Farshad Firouzi (7 shared papers)Sergej Deutsch (2 shared papers)Himanshu Thapliyal (1 shared paper)Mengyun Liu (4 shared papers)
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (7 papers)ACM Transactions on Design Automation of Electronic Systems (2 papers)Energy Science & Engineering (1 paper)Journal of Thermal Science and Engineering Applications (1 paper)IEEE Design and Test (1 paper)
- Partner nations
- United StatesGermanyChina
In The Last Decade
Fangming Ye
29 papers receiving 593 citations
Peers
Comparison fields: 5 of 53
- Hardware and Architecture 192
- Industrial and Manufacturing Engineering 80
- Electrical and Electronic Engineering 385
- Software 24
- Artificial Intelligence 129
Countries citing papers authored by Fangming Ye
This map shows the geographic impact of Fangming Ye's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fangming Ye with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fangming Ye more than expected).
Fields of papers citing papers by Fangming Ye
This network shows the impact of papers produced by Fangming Ye. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fangming Ye. The network helps show where Fangming Ye may publish in the future.
Co-authors
The 23 scholars most cited alongside Fangming Ye, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 89 | |
| 2 | 2013 | 72 | |
| 3 | 2012 | 54 | |
| 4 | 2014 | 47 | |
| 5 | 2015 | 36 | |
| 6 | 2013 | 33 | |
| 7 | 2013 | 27 | |
| 8 | 2015 | 26 | |
| 9 | 2014 | 25 | |
| 10 | 2012 | 22 | |
| 11 | 2015 | 20 | |
| 12 | 2015 | 17 | |
| 13 | 2019 | 14 | |
| 14 | 2014 | 14 | |
| 15 | 2014 | 13 | |
| 16 | 2020 | 13 | |
| 17 | 2018 | 11 | |
| 18 | 2015 | 10 | |
| 19 | 2013 | 9 | |
| 20 | 2018 | 9 |
About Fangming Ye
Fangming Ye is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Industrial and Manufacturing Engineering, Control and Systems Engineering and Statistics, Probability and Uncertainty, having authored 31 papers that have together received 607 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (11 papers), Industrial Vision Systems and Defect Detection (10 papers), Semiconductor materials and devices (9 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Fault Detection and Control Systems (6 papers), 3D IC and TSV technologies (4 papers), Manufacturing Process and Optimization (4 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). The work is most often cited by research in Hardware and Architecture (192 citations), Industrial and Manufacturing Engineering (80 citations), Electrical and Electronic Engineering (385 citations), Software (24 citations) and Artificial Intelligence (129 citations). Fangming Ye has collaborated with scholars based in United States, Germany and China. Frequent co-authors include Krishnendu Chakrabarty, Xinli Gu, Zhaobo Zhang, Mehdi B. Tahoori, Farshad Firouzi, Sergej Deutsch, Himanshu Thapliyal, Mengyun Liu, Xin Li and Bill Eklow. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, ACM Transactions on Design Automation of Electronic Systems, Energy Science & Engineering, Journal of Thermal Science and Engineering Applications and IEEE Design and Test.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.