F. Pio

430 citations
33 papers · 366 · h-index 11

Impact in

Papers in

    • Semiconductor materials and devices 25
    • Advancements in Semiconductor Devices and Circuit Design 15
    • Integrated Circuits and Semiconductor Failure Analysis 11
    • Silicon and Solar Cell Technologies 4
    • Advanced Memory and Neural Computing 4
    • Chalcogenide Semiconductor Thin Films 3
    • Luminescence Properties of Advanced Materials 5

F. Pio

32 papers receiving 333 citations

Peers

F. Pio
Comparison fields: 5 of 32
  • Ceramics and Composites 86
  • Electrical and Electronic Engineering 265
  • Materials Chemistry 204
  • Surfaces, Coatings and Films 12
  • Electronic, Optical and Magnetic Materials 31
Replace Yu. N. Pyrkov with:
Yu. N. Pyrkov Russia
P. Nandi India
B. Bourdon France
R.S. Deol United Kingdom
P. E. R. Nordquist United States
Shigeo Nakajima United States
S. Oğuz United States
N. Duhamel France
A.K. Mairaj United Kingdom
Jonas Jakutis Neto Brazil
F. Pio relative to Yu. N. Pyrkov Russia Yu. N. Pyrkov's profile →
Citations per field
00.5×
Yu. N. Pyrkov · 1×
Citations per year

Countries citing papers authored by F. Pio

Since Specialization
Citations

This map shows the geographic impact of F. Pio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Pio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Pio more than expected).

Fields of papers citing papers by F. Pio

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Pio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Pio. The network helps show where F. Pio may publish in the future.

Co-authors

The 25 scholars most cited alongside F. Pio, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with F. Pio Line = papers co-authored together F. Pio links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199660
2 198740
3 199039
4 199433
5 199326
6 198522
7 199517
8 199614
9 199213
10 199013
11 200111
12
On the Charge Build-Up Mechanisms in Very Thin Insulator Layers
19948
13 19938
14 19847
15 19947
16 19936
17 20006
18 19934
19 20024
20
Double-Poly EEPROM Cell for High Density Memories using Positive and Negative Voltage Programming
19964

About F. Pio

F. Pio is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Ceramics and Composites and Electronic, Optical and Magnetic Materials, having authored 33 papers that have together received 366 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (15 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), Glass properties and applications (5 papers), Luminescence Properties of Advanced Materials (5 papers), Silicon and Solar Cell Technologies (4 papers), Advanced Memory and Neural Computing (4 papers) and Chalcogenide Semiconductor Thin Films (3 papers). The work is most often cited by research in Ceramics and Composites (86 citations), Electrical and Electronic Engineering (265 citations), Materials Chemistry (204 citations), Surfaces, Coatings and Films (12 citations) and Electronic, Optical and Magnetic Materials (31 citations). F. Pio has collaborated with scholars based in Italy, Switzerland and France. Frequent co-authors include M. Guzzi, M. Martini, Carlo Riva, G. Spinolo, C. Papadas, G. Ghibaudo, C. Coluzza, E. Grilli, M. Dutoit and D. Bouvet. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Transactions on Electron Devices, Solid-State Electronics and Electronics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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