F. Pio

438 citations
33 papers · 369 · h-index 11

Impact in

Papers in

F. Pio

32 papers receiving 325 citations

Peers

F. Pio
Comparison fields: 5 of 28
  • Ceramics and Composites 77
  • Electrical and Electronic Engineering 225
  • Surfaces, Coatings and Films 22
  • Radiation 20
  • Materials Chemistry 82
Replace Sean A. McDaniel with:
Sean A. McDaniel United States
Gerd Pfeiffer United States
Jarosław Cimek Poland
R.A. Clay United Kingdom
M. M. Anikin France
N. Ibaraki Japan
Katsuki Furukawa Japan
A. Tervonen Finland
Sandeep Sohal United States
F. Pio relative to Sean A. McDaniel United States Sean A. McDaniel's profile →
Citations per field
00.5×2×3×4×5×
Sean A. McDaniel · 1×
Citations per year

Countries citing papers authored by F. Pio

Since Specialization
Citations

This map shows the geographic impact of F. Pio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Pio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Pio more than expected).

Fields of papers citing papers by F. Pio

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Pio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Pio. The network helps show where F. Pio may publish in the future.

Co-authors

The 25 scholars most cited alongside F. Pio, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with F. Pio Line = papers co-authored together F. Pio links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199661
2 198740
3 199039
4 199433
5 199327
6 198522
7 199517
8 199614
9 199013
10 199213
11 200111
12 19938
13
On the Charge Build-Up Mechanisms in Very Thin Insulator Layers
19948
14 19847
15 19947
16 19936
17 20006
18 20025
19 19934
20 19934

About F. Pio

F. Pio is a scholar working on Electrical and Electronic Engineering, Ceramics and Composites, Materials Chemistry, Electronic, Optical and Magnetic Materials and Radiation, having authored 33 papers that have together received 369 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Glass properties and applications (5 papers), Chalcogenide Semiconductor Thin Films (3 papers), Nuclear materials and radiation effects (2 papers), Crystal Structures and Properties (2 papers), Integrated Circuits and Semiconductor Failure Analysis (2 papers), Silicon Nanostructures and Photoluminescence (1 paper) and 2D Materials and Applications (1 paper). The work is most often cited by research in Ceramics and Composites (77 citations), Electrical and Electronic Engineering (225 citations), Surfaces, Coatings and Films (22 citations), Radiation (20 citations) and Materials Chemistry (82 citations). F. Pio has collaborated with scholars based in Italy, France and Greece. Frequent co-authors include M. Guzzi, Marco Martini, Carlo Giuseppe Riva, G. Spinolo, C. Papadas, G. Ghibaudo, Giorgio Margaritondo, Michel Dutoit, G. Pananakakis and Carlo Coluzza. Their work appears in journals such as Microelectronics Reliability, Solid-State Electronics, Microelectronic Engineering, physica status solidi (a) and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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