Eric Eisenbraun
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electrodeposition and Electroless Coatings
- Gas Sensing Nanomaterials and Sensors
Papers in
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- Semiconductor materials and devices 70
- Electrodeposition and Electroless Coatings 14
- Integrated Circuits and Semiconductor Failure Analysis 5
- Thin-Film Transistor Technologies 5
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- Copper Interconnects and Reliability 54
- Co-authors
- Alain E. Kaloyeros (43 shared papers)Tonmoy Chakraborty (5 shared papers)Spyros Gallis (4 shared papers)Mengbing Huang (4 shared papers)Sumit Kumar (1 shared paper)Michael A. Carpenter (1 shared paper)Zheng Bo (6 shared papers)Kathleen Dunn (5 shared papers)
- Journals
- Journal of materials research/Pratt's guide to venture capital sources (10 papers)Journal of The Electrochemical Society (4 papers)Applied Physics Letters (3 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (3 papers)Journal of Applied Physics (3 papers)
- Partner nations
- United StatesNetherlandsGermany
In The Last Decade
Eric Eisenbraun
92 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 63
- Electronic, Optical and Magnetic Materials 603
- Electrical and Electronic Engineering 1.1k
- Mechanics of Materials 312
- Materials Chemistry 465
- Bioengineering 51
Countries citing papers authored by Eric Eisenbraun
This map shows the geographic impact of Eric Eisenbraun's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Eisenbraun with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Eisenbraun more than expected).
Fields of papers citing papers by Eric Eisenbraun
This network shows the impact of papers produced by Eric Eisenbraun. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Eisenbraun. The network helps show where Eric Eisenbraun may publish in the future.
Co-authors
The 25 scholars most cited alongside Eric Eisenbraun, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 97 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2000 | 337 | |
| 2 | 2007 | 92 | |
| 3 | 2007 | 49 | |
| 4 | 2004 | 41 | |
| 5 | 1992 | 40 | |
| 6 | 2006 | 39 | |
| 7 | 2007 | 38 | |
| 8 | 2001 | 37 | |
| 9 | 2009 | 35 | |
| 10 | 2007 | 30 | |
| 11 | 2009 | 26 | |
| 12 | 2005 | 25 | |
| 13 | 1997 | 25 | |
| 14 | 2001 | 24 | |
| 15 | 2014 | 23 | |
| 16 | 2009 | 22 | |
| 17 | 2003 | 21 | |
| 18 | 2008 | 19 | |
| 19 | 2004 | 19 | |
| 20 | 2000 | 18 |
About Eric Eisenbraun
Eric Eisenbraun is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials and Atomic and Molecular Physics, and Optics, having authored 97 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (70 papers), Copper Interconnects and Reliability (54 papers), Metal and Thin Film Mechanics (18 papers), Electrodeposition and Electroless Coatings (14 papers), Semiconductor materials and interfaces (9 papers), Electronic and Structural Properties of Oxides (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Thin-Film Transistor Technologies (5 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (603 citations), Electrical and Electronic Engineering (1.1k citations), Mechanics of Materials (312 citations), Materials Chemistry (465 citations) and Bioengineering (51 citations). Eric Eisenbraun has collaborated with scholars based in United States, Netherlands and Germany. Frequent co-authors include Alain E. Kaloyeros, Tonmoy Chakraborty, Spyros Gallis, Mengbing Huang, Sumit Kumar, Michael A. Carpenter, Zheng Bo, Kathleen Dunn, John J. Sullivan and O. van der Straten. Their work appears in journals such as Journal of materials research/Pratt's guide to venture capital sources, Journal of The Electrochemical Society, Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.