Barry Arkles
Impact in
- Surfaces, Coatings and Films top 5%
-
- Copper Interconnects and Reliability
Papers in
-
- Semiconductor materials and devices 31
- Molecular Junctions and Nanostructures 11
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- Silicone and Siloxane Chemistry 9
- Silicon Nanostructures and Photoluminescence 6
- Co-authors
- Alain E. Kaloyeros (30 shared papers)Jonathan Goff (17 shared papers)Youlin Pan (12 shared papers)Jennifer Johns (1 shared paper)Angas Hamer (1 shared paper)Roy M. Anderson (1 shared paper)F.A. Jove (2 shared papers)John J. Sullivan (7 shared papers)
- Journals
- Journal of The Electrochemical Society (6 papers)ECS Journal of Solid State Science and Technology (5 papers)The Medical Journal of Australia (3 papers)American Journal of Roentgenology (3 papers)Thin Solid Films (2 papers)
- Partner nations
- United StatesAustraliaUnited Kingdom
In The Last Decade
Barry Arkles
83 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 122
- Surfaces, Coatings and Films 119
- Electronic, Optical and Magnetic Materials 246
- Materials Chemistry 593
- Mechanics of Materials 293
- Electrical and Electronic Engineering 684
Countries citing papers authored by Barry Arkles
This map shows the geographic impact of Barry Arkles's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Barry Arkles with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Barry Arkles more than expected).
Fields of papers citing papers by Barry Arkles
This network shows the impact of papers produced by Barry Arkles. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Barry Arkles. The network helps show where Barry Arkles may publish in the future.
Co-authors
The 25 scholars most cited alongside Barry Arkles, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 90 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1992 | 180 | |
| 2 | 2017 | 126 | |
| 3 | 1989 | 121 | |
| 4 | Silicon compounds : register and review | 1984 | 121 |
| 5 | 2020 | 118 | |
| 6 | 2001 | 80 | |
| 7 | 2016 | 77 | |
| 8 | 1999 | 69 | |
| 9 | 1983 | 57 | |
| 10 | 1999 | 49 | |
| 11 | 2019 | 47 | |
| 12 | 1999 | 43 | |
| 13 | 2016 | 41 | |
| 14 | 1997 | 37 | |
| 15 | 2016 | 31 | |
| 16 | 2001 | 30 | |
| 17 | 1999 | 27 | |
| 18 | 2014 | 26 | |
| 19 | 1996 | 25 | |
| 20 | 1980 | 22 |
About Barry Arkles
Barry Arkles is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Mechanics of Materials and Biomedical Engineering, having authored 90 papers that have together received 1.8k indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Copper Interconnects and Reliability (15 papers), Molecular Junctions and Nanostructures (11 papers), Metal and Thin Film Mechanics (11 papers), Silicone and Siloxane Chemistry (9 papers), Medical Imaging and Pathology Studies (6 papers), Silicon Nanostructures and Photoluminescence (6 papers) and Semiconductor materials and interfaces (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (119 citations), Electronic, Optical and Magnetic Materials (246 citations), Materials Chemistry (593 citations), Mechanics of Materials (293 citations) and Electrical and Electronic Engineering (684 citations). Barry Arkles has collaborated with scholars based in United States, Australia and United Kingdom. Frequent co-authors include Alain E. Kaloyeros, Jonathan Goff, Youlin Pan, Jennifer Johns, Angas Hamer, Roy M. Anderson, F.A. Jove, John J. Sullivan, Cindy Goldberg and Xiaomeng Chen. Their work appears in journals such as Journal of The Electrochemical Society, ECS Journal of Solid State Science and Technology, The Medical Journal of Australia, American Journal of Roentgenology and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.