Daniel Corliss
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
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- Advancements in Photolithography Techniques
- Semiconductor materials and devices
- Plasma Diagnostics and Applications
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Advancements in Photolithography Techniques 21
- Integrated Circuits and Semiconductor Failure Analysis 9
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- Electron and X-Ray Spectroscopy Techniques 8
- Co-authors
- Herbert H. Sawin (1 shared paper)T. Dalton (1 shared paper)John Arnold (3 shared papers)Nelson Felix (9 shared papers)Kafai Lai (5 shared papers)Yann Mignot (5 shared papers)Richard A. Farrell (4 shared papers)Cheng Chi (4 shared papers)
- Journals
- Journal of The Electrochemical Society (1 paper)Nature Electronics (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (15 papers)
- Partner nations
- United StatesGermanyNetherlands
In The Last Decade
Daniel Corliss
22 papers receiving 294 citations
Peers
Comparison fields: 5 of 37
- Surfaces, Coatings and Films 73
- Electrical and Electronic Engineering 212
- Materials Chemistry 107
- Acoustics and Ultrasonics 2
- Media Technology 18
Countries citing papers authored by Daniel Corliss
This map shows the geographic impact of Daniel Corliss's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Daniel Corliss with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Daniel Corliss more than expected).
Fields of papers citing papers by Daniel Corliss
This network shows the impact of papers produced by Daniel Corliss. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Daniel Corliss. The network helps show where Daniel Corliss may publish in the future.
Co-authors
The 25 scholars most cited alongside Daniel Corliss, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 110 | |
| 2 | 1993 | 58 | |
| 3 | 2010 | 40 | |
| 4 | 2004 | 22 | |
| 5 | 2016 | 9 | |
| 6 | 2016 | 7 | |
| 7 | 2014 | 7 | |
| 8 | 2017 | 7 | |
| 9 | 2015 | 7 | |
| 10 | 2015 | 7 | |
| 11 | 2006 | 6 | |
| 12 | 1996 | 6 | |
| 13 | 2013 | 5 | |
| 14 | 2011 | 4 | |
| 15 | 2013 | 4 | |
| 16 | 2015 | 4 | |
| 17 | 2017 | 2 | |
| 18 | 2018 | 2 | |
| 19 | 2019 | 1 | |
| 20 | 1997 | 1 |
About Daniel Corliss
Daniel Corliss is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Computational Mechanics and Mechanical Engineering, having authored 23 papers that have together received 311 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (21 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Nanofabrication and Lithography Techniques (3 papers), Advanced Surface Polishing Techniques (3 papers), Block Copolymer Self-Assembly (2 papers), Advanced Measurement and Metrology Techniques (2 papers) and Industrial Vision Systems and Defect Detection (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (73 citations), Electrical and Electronic Engineering (212 citations), Materials Chemistry (107 citations), Acoustics and Ultrasonics (2 citations) and Media Technology (18 citations). Daniel Corliss has collaborated with scholars based in United States, Germany and Netherlands. Frequent co-authors include Herbert H. Sawin, T. Dalton, John Arnold, Nelson Felix, Kafai Lai, Yann Mignot, Richard A. Farrell, Cheng Chi, Chi‐Chun Liu and Hsinyu Tsai. Their work appears in journals such as Journal of The Electrochemical Society, Nature Electronics, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.