C. Leyris

690 citations
15 papers · 220 · h-index 9

Impact in

    • Advanced Optical Sensing Technologies
    • Advancements in Semiconductor Devices and Circuit Design
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • CCD and CMOS Imaging Sensors
    • Thin-Film Transistor Technologies

Papers in

    • Advancements in Semiconductor Devices and Circuit Design 12
    • Semiconductor materials and devices 6
    • Integrated Circuits and Semiconductor Failure Analysis 5
    • CCD and CMOS Imaging Sensors 4
    • Thin-Film Transistor Technologies 3
    • Radio Frequency Integrated Circuit Design 2
    • Low-power high-performance VLSI design 2
    • Analog and Mixed-Signal Circuit Design 2

C. Leyris

15 papers receiving 215 citations

Peers

C. Leyris
Comparison fields: 5 of 27
  • Instrumentation 15
  • Electrical and Electronic Engineering 209
  • Media Technology 23
  • Acoustics and Ultrasonics 1
  • Hardware and Architecture 5
Replace J.C. Vildeuil with:
J.C. Vildeuil France
F.T. Brady United States
John Ellis-Monaghan United States
C. W. Oh Netherlands
N. Arnold United States
E. Oda Japan
Sang‐Rok Moon South Korea
A. Scuderi Italy
Fanfan Meng United Kingdom
N. Haralabidis Greece
C. Leyris relative to J.C. Vildeuil France J.C. Vildeuil's profile →
Citations per field
00.5×1.5×
J.C. Vildeuil · 1×
Citations per year

Countries citing papers authored by C. Leyris

Since Specialization
Citations

This map shows the geographic impact of C. Leyris's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Leyris with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Leyris more than expected).

Fields of papers citing papers by C. Leyris

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Leyris. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Leyris. The network helps show where C. Leyris may publish in the future.

Co-authors

The 25 scholars most cited alongside C. Leyris, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Leyris Line = papers co-authored together C. Leyris links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 200653
2 201138
3 200628
4 200820
5 200519
6 200615
7 200513
8 200911
9 20079
10 20054
11 20054
12 20072
13 20092
14 20091
15 20091

About C. Leyris

C. Leyris is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Instrumentation and Infectious Diseases, having authored 15 papers that have together received 220 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (12 papers), Semiconductor materials and devices (6 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), CCD and CMOS Imaging Sensors (4 papers), Thin-Film Transistor Technologies (3 papers), Radio Frequency Integrated Circuit Design (2 papers), Low-power high-performance VLSI design (2 papers) and Analog and Mixed-Signal Circuit Design (2 papers). The work is most often cited by research in Instrumentation (15 citations), Electrical and Electronic Engineering (209 citations), Media Technology (23 citations), Acoustics and Ultrasonics (1 citation) and Hardware and Architecture (5 citations). C. Leyris has collaborated with scholars based in France, Switzerland and Czechia. Frequent co-authors include M. Valenza, J.C. Vildeuil, A. Hoffmann, F. Mart́ınez, F. Roy, G. Ghibaudo, S. Haendler, Maud Vinet, A. Pouydebasque and Pierre Magnan. Their work appears in journals such as IEEE Transactions on Electron Devices, Microelectronics Reliability, Microelectronic Engineering, Thin Solid Films and AIP conference proceedings.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact