C. D’Emic

1.9k citations

43 papers · 1.5k · h-index 18

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
Bioengineering top 5%

Papers in

Electrical and Electronic Engineering 42
- Semiconductor materials and devices 33
- Advancements in Semiconductor Devices and Circuit Design 26
- Integrated Circuits and Semiconductor Failure Analysis 15
- Ferroelectric and Negative Capacitance Devices 6
- Silicon and Solar Cell Technologies 5
- Advanced Memory and Neural Computing 4
Atomic and Molecular Physics, and Optics 11
- Magnetic properties of thin films 6
- Semiconductor materials and interfaces 3

Co-authors: E. P. Gusev (11 shared papers)M. Copel (3 shared papers)M. Gribelyuk (3 shared papers)H. Schmidt (4 shared papers)E. Cartier (2 shared papers)D. A. Buchanan (2 shared papers)K. Chan (8 shared papers)P. Kozlowski (3 shared papers)
Journals: Applied Physics Letters (5 papers)Microelectronic Engineering (3 papers)IEEE Transactions on Electron Devices (2 papers)Physical review. B. (2 papers)IEEE Electron Device Letters (2 papers)
Partner nations: United States Japan Canada

In The Last Decade

C. D’Emic

42 papers receiving 1.4k citations

Peers

Countries citing papers authored by C. D’Emic

Since Specialization

Citations

This map shows the geographic impact of C. D’Emic's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. D’Emic with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. D’Emic more than expected).

Fields of papers citing papers by C. D’Emic

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. D’Emic. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. D’Emic. The network helps show where C. D’Emic may publish in the future.

Co-authors

The 25 scholars most cited alongside C. D’Emic, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. D’Emic Line = papers co-authored together C. D’Emic links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues Microelectronic Engineering ·E. P. Gusev, E. Cartier, D. A. Buchanan, M. Gribelyuk, M. Copel, H. Schmidt, C. D’Emic	2001	335
2	Performance dependence of CMOS on silicon substrate orientation for ultrathin oxynitride and HfO₂ gate dielectrics IEEE Electron Device Letters ·Min Yang, E. P. Gusev, M. Ieong, Oleg Gluschenkov, D. Boyd, K. Chan, P. Kozlowski, C. D’Emic, R.M. Sicina, P. Jamison, A. Chou	2003	135
3	SiGe-on-insulator prepared by wafer bonding and layer transfer for high-performance field-effect transistors Applied Physics Letters ·Lida Huang, J. O. Chu, D. Canaperi, C. D’Emic, Ron Anderson, Steven J. Koester, H.‐S. Philip Wong	2001	85
4	Microstructure and thermal stability of HfO2 gate dielectric deposited on Ge(100) Applied Physics Letters ·E. P. Gusev, Huiling Shang, M. Copel, M. Gribelyuk, C. D’Emic, P. Kozlowski, T. Zabel	2004	84
5	Charge detrapping in HfO2 high-κ gate dielectric stacks Applied Physics Letters ·E. P. Gusev, C. D’Emic	2003	83
6	Silicon Nanowire Field Effect Transistor Sensors with Minimal Sensor-to-Sensor Variations and Enhanced Sensing Characteristics ACS Nano ·Sufi Zafar, C. D’Emic, Ashish V. Jagtiani, E. Kratschmer, Xin Miao, Yu Zhu, Renee Mo, Norma Sosa, Hendrik F. Hamann, G. Shahidi, Heike Riel	2018	80
7	Bias-temperature instabilities and radiation effects in MOS devices IEEE Transactions on Nuclear Science ·X. J. Zhou, Daniel M. Fleetwood, J. Félix, E. P. Gusev, C. D’Emic	2005	77
8	Statistical measurement of random telegraph noise and its impact in scaled-down high-κ/metal-gate MOSFETs Hiroshi Miki, Naoki Tega, Masanao Yamaoka, D.J. Frank, Ankur Bansal, M. Kobayashi, K. Cheng, C. D’Emic, Zhe Ren, S. Wu, J-B. Yau, Ye Zhu, Michael Guillorn, D.-G. Park, Wilfried Haensch, E. Leobandung, Kazuyoshi Torii	2012	58
9	Optimization of pH sensing using silicon nanowire field effect transistors with HfO₂as the sensing surface Nanotechnology ·Sufi Zafar, C. D’Emic, Ali Afzali, Benjamin J. Fletcher, Yu Zhu, T.H. Ning	2011	55
10	Electron and hole mobility enhancement in strained SOI by wafer bonding IEEE Transactions on Electron Devices ·Lijuan Huang, J. O. Chu, S. Goma, C. D’Emic, Steven J. Koester, D. Canaperi, P. M. Mooney, Steven A. Cordes, James L. Speidell, Ron Anderson, H.‐S. Philip Wong	2002	44
11	Negative bias-temperature instabilities in metal–oxide–silicon devices with SiO2 and SiOxNy/HfO2 gate dielectrics Applied Physics Letters ·X. J. Zhou, Leonidas Tsetseris, Sergey N. Rashkeev, Daniel M. Fleetwood, Ronald D. Schrimpf, Sokrates T. Pantelides, J. Félix, E. P. Gusev, C. D’Emic	2004	41
12	Deep trench plasma etching of single crystal silicon using SF6/O2 gas mixtures Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·C. D’Emic, K. Chan, J. M. Blum	1992	39
13	80 nm polysilicon gated n-FETs with ultra-thin Al/sub 2/O/sub 3/ gate dielectric for ULSI applications D. A. Buchanan, E. P. Gusev, E. Cartier, H. Schmidt, K. Rim, M. Gribelyuk, A. Mocuta, A. Ajmera, M. Copel, Supratik Guha, N. A. Bojarczuk, Agnese Callegari, C. D’Emic, P. Kozlowski, K. Chan, R.J. Fleming, P. Jamison, I. Brown, R. A. Arndt	2002	38
14	Spatially Confined Chemistry: Fabrication of Ge Quantum Dot Arrays The Journal of Physical Chemistry ·James R. Heath, R. Stanley Williams, J. J. Shiang, Shalom J. Wind, Junmei Chu, C. D’Emic, W. Chen, C. Stanis, J. J. Bucchignano	1996	32
15	Charge trapping and detrapping in HfO2 high-κ gate stacks Microelectronic Engineering ·E. P. Gusev, C. D’Emic, Sufi Zafar, Atul Kumar	2004	32
16	Carrier mobility enhancement in strained Si-on-insulator fabricated by wafer bonding Lixiao Huang, J. O. Chu, S. Goma, C. D’Emic, Steven J. Koester, D. Canaperi, P. M. Mooney, Steven A. Cordes, James L. Speidell, Ron Anderson, H.‐S. Philip Wong	2002	25
17	Mobility enhancement in strained Si NMOSFETs with HfO/sub 2/ gate dielectrics K. Rim, E. P. Gusev, C. D’Emic, T. Kanarsky, H. Chen, J. O. Chu, J. A. Ott, K. Chan, D. Boyd, V. Mazzeo, B.H. Lee, A. Mocuta, J.J. Welser, Shlomo Cohen, M. Leong, H.‐S. Philip Wong	2003	23
18	Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETs H. Miki, Masami Yamaoka, Naoki Tega, Zhibin Ren, Masaharu Kobayashi, C. D’Emic, Yu Zhu, D.J. Frank, Michael Guillorn, D.-G. Park, Wilfried Haensch, Kazuyoshi Torii	2011	21
19	Low-frequency noise and radiation response of metal-oxide-semiconductor transistors with Al2O3/SiOxNy/Si(100) gate stacks Applied Physics Letters ·Hao Xiong, Daniel M. Fleetwood, J. Félix, E. P. Gusev, C. D’Emic	2003	17
20	Reliable Sub-Nanosecond Switching in Magnetic Tunnel Junctions for MRAM Applications IEEE Transactions on Electron Devices ·Christopher Safranski, G. Hu, J. Z. Sun, Pouya Hashemi, S. Brown, L. Buzi, C. D’Emic, Eric R. J. Edwards, E. Galligan, M. Gottwald, Oki Gunawan, S. Karimeddiny, Hyunsung Jung, Juhyun Kim, K. Latzko, P. L. Trouilloud, D. C. Worledge	2022	17

About C. D’Emic

C. D’Emic is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Biomedical Engineering and Materials Chemistry, having authored 43 papers that have together received 1.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (33 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Ferroelectric and Negative Capacitance Devices (6 papers), Magnetic properties of thin films (6 papers), Silicon and Solar Cell Technologies (5 papers), Advanced Memory and Neural Computing (4 papers) and Semiconductor materials and interfaces (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Bioengineering (66 citations), Atomic and Molecular Physics, and Optics (229 citations), Materials Chemistry (312 citations) and Biomedical Engineering (204 citations). C. D’Emic has collaborated with scholars based in United States, Japan and Canada. Frequent co-authors include E. P. Gusev, M. Copel, M. Gribelyuk, H. Schmidt, E. Cartier, D. A. Buchanan, K. Chan, P. Kozlowski, Daniel M. Fleetwood and J. Félix. Their work appears in journals such as Applied Physics Letters, Microelectronic Engineering, IEEE Transactions on Electron Devices, Physical review. B. and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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