C. C. Williams

4.5k citations
84 papers · 3.3k · 1 hit paper · h-index 29

Impact in

Papers in

C. C. Williams

83 papers receiving 3.1k citations

C. C. Williams's Hit Papers

Atomic force microscope–force mapping and profiling on a sub 100-Å scale 1987 · 983 citations
9830+13+26Years since publication250500750

Peers

C. C. Williams
Comparison fields: 5 of 102
  • Atomic and Molecular Physics, and Optics 2.6k
  • Structural Biology 82
  • Electrical and Electronic Engineering 1.8k
  • Biomedical Engineering 1.3k
  • Bioengineering 73
Replace J. Schneir with:
J. Schneir United States
Ivo W. Rangelow Germany
T. Baron France
Y. Martin United Kingdom
P. Grabiec Poland
H. Brückl Germany
C. R. K. Marrian United States
S. A. Rishton United States
N. Barniol Spain
M. I. Lutwyche Japan
C. C. Williams relative to J. Schneir United States J. Schneir's profile →
Citations per field
00.5×2.8×
J. Schneir · 1×
Citations per year

Countries citing papers authored by C. C. Williams

Since Specialization
Citations

This map shows the geographic impact of C. C. Williams's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. C. Williams with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. C. Williams more than expected).

Fields of papers citing papers by C. C. Williams

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. C. Williams. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. C. Williams. The network helps show where C. C. Williams may publish in the future.

Co-authors

The 25 scholars most cited alongside C. C. Williams, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. C. Williams Line = papers co-authored together C. C. Williams links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 84 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Atomic force microscope–force mapping and profiling on a sub 100-Å scale
Hit paper breakdown →
1987983
2 1986279
3 1989156
4 1999152
5 1989132
6 199972
7 198665
8 199064
9 199664
10 199961
11 199857
12 199555
13 199450
14 199549
15 199347
16 199546
17 198846
18 200437
19 199636
20 199634

About C. C. Williams

C. C. Williams is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry and Mechanics of Materials, having authored 84 papers that have together received 3.3k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (63 papers), Integrated Circuits and Semiconductor Failure Analysis (32 papers), Near-Field Optical Microscopy (22 papers), Mechanical and Optical Resonators (21 papers), Molecular Junctions and Nanostructures (15 papers), Semiconductor materials and devices (15 papers), Surface and Thin Film Phenomena (11 papers) and Semiconductor materials and interfaces (8 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (2.6k citations), Structural Biology (82 citations), Electrical and Electronic Engineering (1.8k citations), Biomedical Engineering (1.3k citations) and Bioengineering (73 citations). C. C. Williams has collaborated with scholars based in United States, South Korea and Belgium. Frequent co-authors include H. K. Wickramasinghe, Y. Martin, J. S. McMurray, J. Slinkman, Ezra Bussmann, Vladimir V. Zavyalov, S. A. Rishton, Levente J. Klein, David W. Abraham and Robert C. Davis. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Review of Scientific Instruments, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Optics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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