B. M. Ullrich
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and interfaces
Papers in
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- Semiconductor materials and devices 4
- Electronic Packaging and Soldering Technologies 2
- Silicon and Solar Cell Technologies 2
- Integrated Circuits and Semiconductor Failure Analysis 2
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- Metal and Thin Film Mechanics 5
- Co-authors
- J. W. Mayer (6 shared papers)T. L. Alford (6 shared papers)Thomas Laursen (4 shared papers)Daniel Adams (1 shared paper)S.S. Lau (2 shared papers)N.W. Cheung (2 shared papers)F. J. Grunthaner (1 shared paper)P. J. Grunthaner (1 shared paper)
- Journals
- Applied Physics Letters (3 papers)Journal of Applied Physics (3 papers)Thin Solid Films (1 paper)Surface and Coatings Technology (1 paper)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (1 paper)
- Partner nations
- United StatesJapan
In The Last Decade
B. M. Ullrich
12 papers receiving 318 citations
Peers
Comparison fields: 5 of 29
- Electronic, Optical and Magnetic Materials 113
- Atomic and Molecular Physics, and Optics 139
- Electrical and Electronic Engineering 214
- Computational Mechanics 62
- General Materials Science 9
Countries citing papers authored by B. M. Ullrich
This map shows the geographic impact of B. M. Ullrich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. M. Ullrich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. M. Ullrich more than expected).
Fields of papers citing papers by B. M. Ullrich
This network shows the impact of papers produced by B. M. Ullrich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. M. Ullrich. The network helps show where B. M. Ullrich may publish in the future.
Co-authors
The 25 scholars most cited alongside B. M. Ullrich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1981 | 69 | |
| 2 | 1996 | 67 | |
| 3 | 1980 | 48 | |
| 4 | 1975 | 46 | |
| 5 | 1997 | 25 | |
| 6 | 1998 | 21 | |
| 7 | 1985 | 17 | |
| 8 | 1997 | 14 | |
| 9 | 1990 | 11 | |
| 10 | 1999 | 10 | |
| 11 | 1986 | 2 | |
| 12 | 1997 | 2 |
About B. M. Ullrich
B. M. Ullrich is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Electronic, Optical and Magnetic Materials, Computational Mechanics and Materials Chemistry, having authored 12 papers that have together received 332 indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (5 papers), Copper Interconnects and Reliability (5 papers), Ion-surface interactions and analysis (4 papers), Semiconductor materials and devices (4 papers), Semiconductor materials and interfaces (3 papers), Electronic Packaging and Soldering Technologies (2 papers), Silicon and Solar Cell Technologies (2 papers) and Integrated Circuits and Semiconductor Failure Analysis (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (113 citations), Atomic and Molecular Physics, and Optics (139 citations), Electrical and Electronic Engineering (214 citations), Computational Mechanics (62 citations) and General Materials Science (9 citations). B. M. Ullrich has collaborated with scholars based in United States and Japan. Frequent co-authors include J. W. Mayer, T. L. Alford, Thomas Laursen, Daniel Adams, S.S. Lau, N.W. Cheung, F. J. Grunthaner, P. J. Grunthaner, C. A. Evans and R. J. Blattner. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Thin Solid Films, Surface and Coatings Technology and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.