B. C. Valek

1.2k citations

23 papers · 942 · h-index 13

Impact in

Structural Biology top 5%
Electronic, Optical and Magnetic Materials top 10%
- Copper Interconnects and Reliability

Papers in

Mechanics of Materials 19
- Metal and Thin Film Mechanics 18
Electronic, Optical and Magnetic Materials 19
- Copper Interconnects and Reliability 19

Co-authors: Nobumichi Tamura (21 shared papers)Ralph Spolenak (18 shared papers)J. R. Patel (17 shared papers)H. A. Padmore (12 shared papers)Alastair A. MacDowell (11 shared papers)Richard Celestre (12 shared papers)J. C. Bravman (14 shared papers)B. W. Batterman (11 shared papers)
Journals: Applied Physics Letters (4 papers)Journal of Applied Physics (3 papers)Journal of Synchrotron Radiation (1 paper)Microelectronic Engineering (1 paper)Journal of Applied Mechanics (1 paper)
Partner nations: United States Switzerland Germany

In The Last Decade

B. C. Valek

21 papers receiving 913 citations

Peers

Countries citing papers authored by B. C. Valek

Since Specialization

Citations

This map shows the geographic impact of B. C. Valek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. C. Valek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. C. Valek more than expected).

Fields of papers citing papers by B. C. Valek

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. C. Valek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. C. Valek. The network helps show where B. C. Valek may publish in the future.

Co-authors

The 25 scholars most cited alongside B. C. Valek, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with B. C. Valek Line = papers co-authored together B. C. Valek links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films Journal of Synchrotron Radiation ·Nobumichi Tamura, Alastair A. MacDowell, Ralph Spolenak, B. C. Valek, J. C. Bravman, W. L. Brown, Richard Celestre, H. A. Padmore, B. W. Batterman, J. R. Patel	2003	213
2	Submicron x-ray diffraction and its applications to problems in materials and environmental science Review of Scientific Instruments ·Nobumichi Tamura, Richard Celestre, Alastair A. MacDowell, H. A. Padmore, Ralph Spolenak, B. C. Valek, Nai-Luon Chang, A. Manceau, J. R. Patel	2002	146
3	Crystal plasticity in Cu damascene interconnect lines undergoing electromigration as revealed by synchrotron x-ray microdiffraction Applied Physics Letters ·Arief Suriadi Budiman, William D. Nix, Nobumichi Tamura, B. C. Valek, Kaustubh S. Gadre, J. Maiz, Ralph Spolenak, J. R. Patel	2006	81
4	Submicron X-ray diffraction Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·Alastair A. MacDowell, Richard Celestre, Nobumichi Tamura, Ralph Spolenak, B. C. Valek, W. L. Brown, J. C. Bravman, H. A. Padmore, B. W. Batterman, J. R. Patel	2001	78
5	High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction Applied Physics Letters ·Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, B. C. Valek, J. C. Bravman, Ralph Spolenak, W. L. Brown, T. Marieb, H. Fujimoto, B. W. Batterman, J. R. Patel	2002	69
6	Electromigration-induced plastic deformation in passivated metal lines Applied Physics Letters ·B. C. Valek, J. C. Bravman, Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, Ralph Spolenak, W. L. Brown, B. W. Batterman, J. R. Patel	2002	61
7	Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction Applied Physics Letters ·Albert T. Wu, K. N. Tu, J. R. Lloyd, Nobumichi Tamura, B. C. Valek, C. R. Kao	2004	51
8	Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction Physical Review Letters ·Ralph Spolenak, W. L. Brown, Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, B. C. Valek, J. C. Bravman, T. Marieb, H. Fujimoto, B. W. Batterman, J. R. Patel	2003	50
9	Early stage of plastic deformation in thin films undergoing electromigration Journal of Applied Physics ·B. C. Valek, Nobumichi Tamura, Ralph Spolenak, W. A. Caldwell, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, J. C. Bravman, B. W. Batterman, William D. Nix, J. R. Patel	2003	44
10	Plastic deformation in Al (Cu) interconnects stressed by electromigration and studied by synchrotron polychromatic x-ray microdiffraction Journal of Applied Physics ·Kai Chen, Nobumichi Tamura, B. C. Valek, K. N. Tu	2008	41
11	Quantitative analysis of dislocation arrangements induced by electromigration in a passivated Al (0.5 wt % Cu) interconnect Journal of Applied Physics ·Rozaliya Barabash, Gene E. Ice, Nobumichi Tamura, B. C. Valek, J. C. Bravman, Ralph Spolenak, J. R. Patel	2003	24
12	A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems Journal of Applied Mechanics ·M.A. Brown, Tae‐Soon Park, Ares J. Rosakis, Ersan Üstündag, Young Huang, Nobumichi Tamura, B. C. Valek	2005	22
13	Silica thin films applied to Ni-20Cr alloy via combustion chemical vapor deposition Surface and Coatings Technology ·B. C. Valek, J. M. Hampikian	1997	13
14	Quantitative characterization of electromigration-induced plastic deformation in Al(0.5wt%Cu) interconnect Microelectronic Engineering ·Rozaliya Barabash, Gene E. Ice, Nobumichi Tamura, B. C. Valek, J. C. Bravman, Ralph Spolenak, J. R. Patel	2004	12
15	Microtexture and Strain in Electroplated Copper Interconnects MRS Proceedings ·Ralph Spolenak, D. Barr, M. E. Gross, K. Evans‐Lutterodt, W. L. Brown, Nobumichi Tamura, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, B. C. Valek, J. C. Bravman, P. A. Flinn, T. Marieb, Robert R. Keller, B. W. Batterman, J. R. Patel	2000	11
16	Grain Orientation and Strain Measurements in Sub-Micron wide Passivated Individual Aluminum Test Structures MRS Proceedings ·Nobumichi Tamura, B. C. Valek, Ralph Spolenak, A. A. MacDowell, Richard Celestre, H. A. Padmore, W. L. Brown, T. Marieb, J. C. Bravman, B. W. Batterman, J. R. Patel	2000	8
17	X-ray microdiffraction studies of mechanical behavior and electromigration in thin film structures B. C. Valek	2003	5
18	Local Microstructure and Stress in Al(Cu) Thin Film Structures Studied by X-Ray Microdiffraction MRS Proceedings ·B. C. Valek, Nobumichi Tamura, Ralph Spolenak, Alastair A. MacDowell, Richard Celestre, H. A. Padmore, J. C. Bravman, W. L. Brown, B. W. Batterman, J. R. Patel	2001	5
19	Electromigration-Induced Plastic Deformation in Cu Damascene Interconnect Lines as Revealed by Synchrotron X-Ray Microdiffraction MRS Proceedings ·Arief Suriadi Budiman, Nobumichi Tamura, B. C. Valek, Kaustubh S. Gadre, J. Maiz, Ralph Spolenak, J. R. Patel, William D. Nix	2006	4
20	Unexpected Mode of Plastic Deformation in Cu Damascene Lines Undergoing Electromigration MRS Proceedings ·Arief Suriadi Budiman, Nobumichi Tamura, B. C. Valek, Kaustubh S. Gadre, J. Maiz, Ralph Spolenak, W. A. Caldwell, William D. Nix, J. R. Patel	2004	2

About B. C. Valek

B. C. Valek is a scholar working on Mechanics of Materials, Electronic, Optical and Magnetic Materials, Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry, having authored 23 papers that have together received 942 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (19 papers), Metal and Thin Film Mechanics (18 papers), Electronic Packaging and Soldering Technologies (8 papers), Advanced Surface Polishing Techniques (4 papers), Advancements in Photolithography Techniques (3 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Microstructure and mechanical properties (2 papers) and Force Microscopy Techniques and Applications (2 papers). The work is most often cited by research in Structural Biology (43 citations), Electronic, Optical and Magnetic Materials (280 citations), Radiation (113 citations), Mechanics of Materials (276 citations) and Materials Chemistry (377 citations). B. C. Valek has collaborated with scholars based in United States, Switzerland and Germany. Frequent co-authors include Nobumichi Tamura, Ralph Spolenak, J. R. Patel, H. A. Padmore, Alastair A. MacDowell, Richard Celestre, J. C. Bravman, B. W. Batterman, W. L. Brown and K. N. Tu. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, Journal of Synchrotron Radiation, Microelectronic Engineering and Journal of Applied Mechanics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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B. C. Valek

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