Akemi Hamada
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced MEMS and NEMS Technologies
- Radiation Effects in Electronics
- Electronic Packaging and Soldering Technologies
- Silicon Carbide Semiconductor Technologies
Papers in
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- Semiconductor materials and devices 14
- Advancements in Semiconductor Devices and Circuit Design 4
- Integrated Circuits and Semiconductor Failure Analysis 3
- Radiation Effects in Electronics 2
- Silicon Carbide Semiconductor Technologies 1
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- VLSI and Analog Circuit Testing 1
- Co-authors
- Cary Y. Yang (4 shared papers)Reinout Woltjer (3 shared papers)K. Hinode (2 shared papers)Hisao Katto (2 shared papers)Yuzuru Ohji (2 shared papers)Yasushiro Nishioka (1 shared paper)T. Toyabe (1 shared paper)Toshio Sasaki (1 shared paper)
- Journals
- IEEE Transactions on Electron Devices (3 papers)Japanese Journal of Applied Physics (2 papers)IEEE Electron Device Letters (2 papers)Semiconductor Science and Technology (2 papers)Microelectronics Reliability (1 paper)
- Partner nations
- JapanUnited StatesNetherlands
In The Last Decade
Akemi Hamada
16 papers receiving 444 citations
Peers
Comparison fields: 5 of 23
- Electrical and Electronic Engineering 444
- Hardware and Architecture 22
- Safety, Risk, Reliability and Quality 12
- Biomedical Engineering 34
- Atomic and Molecular Physics, and Optics 17
Countries citing papers authored by Akemi Hamada
This map shows the geographic impact of Akemi Hamada's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Akemi Hamada with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Akemi Hamada more than expected).
Fields of papers citing papers by Akemi Hamada
This network shows the impact of papers produced by Akemi Hamada. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Akemi Hamada. The network helps show where Akemi Hamada may publish in the future.
Co-authors
The 8 scholars most cited alongside Akemi Hamada, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Hot-Carrier Effects in MOS Devices | 1995 | 188 |
| 2 | 1991 | 126 | |
| 3 | 1993 | 58 | |
| 4 | 1990 | 20 | |
| 5 | 1994 | 20 | |
| 6 | 1992 | 16 | |
| 7 | 1992 | 11 | |
| 8 | 1989 | 9 | |
| 9 | 1987 | 6 | |
| 10 | 1993 | 6 | |
| 11 | 1989 | 5 | |
| 12 | 1989 | 4 | |
| 13 | 1990 | 2 | |
| 14 | 1995 | 2 | |
| 15 | 2003 | 2 | |
| 16 | 1991 | 1 |
About Akemi Hamada
Akemi Hamada is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Nuclear Energy and Engineering and Waste Management and Disposal, having authored 16 papers that have together received 476 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (4 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Radiation Effects in Electronics (2 papers), Silicon Carbide Semiconductor Technologies (1 paper), Semiconductor materials and interfaces (1 paper) and VLSI and Analog Circuit Testing (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (444 citations), Hardware and Architecture (22 citations), Safety, Risk, Reliability and Quality (12 citations), Biomedical Engineering (34 citations) and Atomic and Molecular Physics, and Optics (17 citations). Akemi Hamada has collaborated with scholars based in Japan, United States and Netherlands. Frequent co-authors include Cary Y. Yang, Reinout Woltjer, K. Hinode, Hisao Katto, Yuzuru Ohji, Yasushiro Nishioka, T. Toyabe and Toshio Sasaki. Their work appears in journals such as IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics, IEEE Electron Device Letters, Semiconductor Science and Technology and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.