Y. Arnal
Impact in
- Mechanics of Materials top 5%
- Metal and Thin Film Mechanics
-
- Plasma Diagnostics and Applications
- Semiconductor materials and devices
Papers in
-
- Plasma Diagnostics and Applications 28
- Semiconductor materials and devices 7
-
- Metal and Thin Film Mechanics 21
- Co-authors
- Jacques Pelletier (34 shared papers)A. Lacoste (13 shared papers)A. Durandet (5 shared papers)O. Joubert (2 shared papers)C. Pomot (5 shared papers)L. Vallier (1 shared paper)Barbara Petit (3 shared papers)Shih‐I Chu (1 shared paper)
In The Last Decade
Y. Arnal
40 papers receiving 764 citations
Peers
Comparison fields: 5 of 36
- Mechanics of Materials 349
- Electrical and Electronic Engineering 666
- Aerospace Engineering 190
- Nuclear and High Energy Physics 84
- Electronic, Optical and Magnetic Materials 109
Countries citing papers authored by Y. Arnal
This map shows the geographic impact of Y. Arnal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Y. Arnal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Y. Arnal more than expected).
Fields of papers citing papers by Y. Arnal
This network shows the impact of papers produced by Y. Arnal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Y. Arnal. The network helps show where Y. Arnal may publish in the future.
Co-authors
The 25 scholars most cited alongside Y. Arnal, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1988 | 104 | |
| 2 | 1989 | 84 | |
| 3 | 2002 | 67 | |
| 4 | 1997 | 36 | |
| 5 | 2001 | 36 | |
| 6 | 1984 | 32 | |
| 7 | 2000 | 31 | |
| 8 | 1986 | 30 | |
| 9 | 2001 | 28 | |
| 10 | 1987 | 26 | |
| 11 | 2004 | 24 | |
| 12 | 1987 | 22 | |
| 13 | 1988 | 21 | |
| 14 | 2001 | 21 | |
| 15 | 1999 | 20 | |
| 16 | 1984 | 20 | |
| 17 | 1986 | 20 | |
| 18 | 1998 | 18 | |
| 19 | 1997 | 18 | |
| 20 | 1999 | 17 |
About Y. Arnal
Y. Arnal is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Aerospace Engineering, Materials Chemistry and Computational Mechanics, having authored 40 papers that have together received 845 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (28 papers), Metal and Thin Film Mechanics (21 papers), Particle accelerators and beam dynamics (10 papers), Ion-surface interactions and analysis (9 papers), Copper Interconnects and Reliability (8 papers), Diamond and Carbon-based Materials Research (7 papers), Magnetic confinement fusion research (7 papers) and Semiconductor materials and devices (7 papers). The work is most often cited by research in Mechanics of Materials (349 citations), Electrical and Electronic Engineering (666 citations), Aerospace Engineering (190 citations), Nuclear and High Energy Physics (84 citations) and Electronic, Optical and Magnetic Materials (109 citations). Y. Arnal has collaborated with scholars based in France, Canada and Germany. Frequent co-authors include Jacques Pelletier, A. Lacoste, A. Durandet, O. Joubert, C. Pomot, L. Vallier, Barbara Petit, Shih‐I Chu, S. Béchu and O. Lesaint. Their work appears in journals such as Surface and Coatings Technology, Plasma Sources Science and Technology, Review of Scientific Instruments, Physics Letters A and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.