X. Hoffer

14 papers receiving 421 citations

Peers

X. Hoffer
Comparison fields: 5 of 37
  • Atomic and Molecular Physics, and Optics 277
  • Condensed Matter Physics 68
  • Materials Chemistry 233
  • Electronic, Optical and Magnetic Materials 83
  • Electrical and Electronic Engineering 167
Replace Zhen Zhan with:
Zhen Zhan Spain
José V. Anguita Spain
Piranavan Kumaravadivel United States
Ching‐Ray Chang Taiwan
David C. Dillen United States
M. R. Sakr Egypt
Christian Czekalla Germany
Sharidya Rahman Australia
Redouane En‐nadir Morocco
Christian N. Saggau Germany
X. Hoffer relative to Zhen Zhan Spain Zhen Zhan's profile →
Citations per field
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Zhen Zhan · 1×
Citations per year

Countries citing papers authored by X. Hoffer

Since Specialization
Citations

This map shows the geographic impact of X. Hoffer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by X. Hoffer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites X. Hoffer more than expected).

Fields of papers citing papers by X. Hoffer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by X. Hoffer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by X. Hoffer. The network helps show where X. Hoffer may publish in the future.

Co-authors

The 17 scholars most cited alongside X. Hoffer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with X. Hoffer Line = papers co-authored together X. Hoffer links everyone, so they are left out of the graph.

All Works

15 of 15 papers shown
#Work
1 200354
2 200352
3 200248
4 200248
5 200347
6 200341
7 200434
8 200529
9 200325
10 200421
11 200514
12 200113
13 20079
14 20031
15 20031

About X. Hoffer

X. Hoffer is a scholar working on Atomic and Molecular Physics, and Optics, Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics and Electronic, Optical and Magnetic Materials, having authored 15 papers that have together received 437 indexed citations. Recurring topics across this work include Magnetic properties of thin films (8 papers), Anodic Oxide Films and Nanostructures (7 papers), Nanoporous metals and alloys (5 papers), Quantum and electron transport phenomena (4 papers), Theoretical and Computational Physics (3 papers), Magnetic Properties and Applications (3 papers), Nanowire Synthesis and Applications (2 papers) and Advanced Memory and Neural Computing (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (277 citations), Condensed Matter Physics (68 citations), Materials Chemistry (233 citations), Electronic, Optical and Magnetic Materials (83 citations) and Electrical and Electronic Engineering (167 citations). X. Hoffer has collaborated with scholars based in Switzerland, France and Japan. Frequent co-authors include Jean‐Philippe Ansermet, L. Gravier, Jean-Eric Wegrowe, Takeshi Ohgai, A. C. Fabian, Derek M. Kelly, Ph. Guittienne, Travis L. Wade, J.-E. Wegrowe and J.-M. Bonard. Their work appears in journals such as Physical review. B, Condensed matter, Journal of Applied Electrochemistry, Nanotechnology, Journal of Applied Physics and Journal of Physics D Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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