X. Boddaert

552 citations
26 papers · 483 · h-index 10

Impact in

Papers in

    • Semiconductor materials and devices 7
    • Nanomaterials and Printing Technologies 5
    • Integrated Circuits and Semiconductor Failure Analysis 4
    • Thin-Film Transistor Technologies 4
    • Organic Electronics and Photovoltaics 3
    • Electronic Packaging and Soldering Technologies 3
    • Advanced Sensor and Energy Harvesting Materials 8

X. Boddaert

26 papers receiving 461 citations

Peers

X. Boddaert
Comparison fields: 5 of 51
  • Nuclear Energy and Engineering 23
  • Electrical and Electronic Engineering 333
  • Polymers and Plastics 69
  • Atomic and Molecular Physics, and Optics 144
  • Biomedical Engineering 171
Replace Jikai Xu with:
Jikai Xu China
Takahiro Kozeki Japan
Qingmei Hu China
Jérémy Streque France
Abu Riduan Md Foisal Australia
Seul Ki Hong South Korea
Youngkee Eun South Korea
Supasarote Muensit Thailand
Yi‐Jen Chan Taiwan
Hong-Quan Nguyen Taiwan
X. Boddaert relative to Jikai Xu China Jikai Xu's profile →
Citations per field
00.5×10×15×21×
Jikai Xu · 1×
Citations per year

Countries citing papers authored by X. Boddaert

Since Specialization
Citations

This map shows the geographic impact of X. Boddaert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by X. Boddaert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites X. Boddaert more than expected).

Fields of papers citing papers by X. Boddaert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by X. Boddaert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by X. Boddaert. The network helps show where X. Boddaert may publish in the future.

Co-authors

The 25 scholars most cited alongside X. Boddaert, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with X. Boddaert Line = papers co-authored together X. Boddaert links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1990108
2 198693
3 201586
4 201129
5 201527
6 201225
7 201118
8 202315
9 201212
10 20179
11 20028
12 20157
13 20137
14 20157
15 19896
16 20225
17 20005
18 20104
19 20243
20 20083

About X. Boddaert

X. Boddaert is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Polymers and Plastics, having authored 26 papers that have together received 483 indexed citations. Recurring topics across this work include Advanced Sensor and Energy Harvesting Materials (8 papers), Semiconductor materials and devices (7 papers), Semiconductor materials and interfaces (5 papers), Nanomaterials and Printing Technologies (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Thin-Film Transistor Technologies (4 papers), Organic Electronics and Photovoltaics (3 papers) and Electronic Packaging and Soldering Technologies (3 papers). The work is most often cited by research in Nuclear Energy and Engineering (23 citations), Electrical and Electronic Engineering (333 citations), Polymers and Plastics (69 citations), Atomic and Molecular Physics, and Optics (144 citations) and Biomedical Engineering (171 citations). X. Boddaert has collaborated with scholars based in France, Kazakhstan and Germany. Frequent co-authors include D. Stiévenard, J. C. Bourgoin, P. Benaben, H. J. von Bardeleben, Rubaiyet Iftekharul Haque, Erick Ogam, R. Coppard, R. Gwoziecki, Roger Delattre and Thierry Djenizian. Their work appears in journals such as Sensors, Physical review. B, Condensed matter, Microelectronics Reliability, Thin Solid Films and Advanced Engineering Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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