W.R. Daasch
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
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- Industrial Vision Systems and Defect Detection
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 18
- Advancements in Semiconductor Devices and Circuit Design 9
- Low-power high-performance VLSI design 6
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- VLSI and Analog Circuit Testing 18
- Co-authors
- D. Taylor (1 shared paper)R. Madge (6 shared papers)James McNames (3 shared papers)Madan M. Rehani (1 shared paper)Brady Benware (3 shared papers)Ernest R. Davidson (6 shared papers)Kenneth M. Butler (4 shared papers)R. Schaumann (7 shared papers)
- Journals
- The Journal of Chemical Physics (4 papers)Electronics Letters (2 papers)Journal of Parallel and Distributed Computing (1 paper)International Journal of Circuit Theory and Applications (1 paper)IEEE Transactions on Computers (1 paper)
- Partner nations
- United StatesIndiaGermany
In The Last Decade
W.R. Daasch
41 papers receiving 810 citations
Peers
Comparison fields: 5 of 61
- Hardware and Architecture 590
- Industrial and Manufacturing Engineering 119
- Electrical and Electronic Engineering 656
- Statistics, Probability and Uncertainty 41
- Cellular and Molecular Neuroscience 81
Countries citing papers authored by W.R. Daasch
This map shows the geographic impact of W.R. Daasch's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.R. Daasch with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.R. Daasch more than expected).
Fields of papers citing papers by W.R. Daasch
This network shows the impact of papers produced by W.R. Daasch. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.R. Daasch. The network helps show where W.R. Daasch may publish in the future.
Co-authors
The 25 scholars most cited alongside W.R. Daasch, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 202 | |
| 2 | 2002 | 92 | |
| 3 | 2003 | 78 | |
| 4 | 2002 | 68 | |
| 5 | 2003 | 41 | |
| 6 | 2003 | 33 | |
| 7 | 2004 | 29 | |
| 8 | 2006 | 26 | |
| 9 | 2002 | 24 | |
| 10 | 2002 | 23 | |
| 11 | 1980 | 22 | |
| 12 | 2006 | 19 | |
| 13 | 2002 | 18 | |
| 14 | 2011 | 17 | |
| 15 | 1995 | 15 | |
| 16 | 2007 | 14 | |
| 17 | 2006 | 13 | |
| 18 | 2006 | 13 | |
| 19 | 1982 | 12 | |
| 20 | 2009 | 12 |
About W.R. Daasch
W.R. Daasch is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Industrial and Manufacturing Engineering and Statistics, Probability and Uncertainty, having authored 43 papers that have together received 862 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), VLSI and Analog Circuit Testing (18 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Low-power high-performance VLSI design (6 papers), Industrial Vision Systems and Defect Detection (5 papers), Analog and Mixed-Signal Circuit Design (5 papers), Advanced Statistical Process Monitoring (4 papers) and Advanced Statistical Methods and Models (4 papers). The work is most often cited by research in Hardware and Architecture (590 citations), Industrial and Manufacturing Engineering (119 citations), Electrical and Electronic Engineering (656 citations), Statistics, Probability and Uncertainty (41 citations) and Cellular and Molecular Neuroscience (81 citations). W.R. Daasch has collaborated with scholars based in United States, India and Germany. Frequent co-authors include D. Taylor, R. Madge, James McNames, Madan M. Rehani, Brady Benware, Ernest R. Davidson, Kenneth M. Butler, R. Schaumann, John M. Carulli and Michael A. Driscoll. Their work appears in journals such as The Journal of Chemical Physics, Electronics Letters, Journal of Parallel and Distributed Computing, International Journal of Circuit Theory and Applications and IEEE Transactions on Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.