V.P. Nelson

719 citations
38 papers · 480 · h-index 9

Impact in

    • VLSI and Analog Circuit Testing
    • Real-Time Systems Scheduling
    • Parallel Computing and Optimization Techniques
  • Software top 10%
    • Software Reliability and Analysis Research

Papers in

V.P. Nelson

33 papers receiving 435 citations

Peers

V.P. Nelson
Comparison fields: 5 of 65
  • Hardware and Architecture 188
  • Software 54
  • Computer Networks and Communications 166
  • Safety, Risk, Reliability and Quality 41
  • Statistics, Probability and Uncertainty 28
Replace Lin Huang with:
Lin Huang China
Jeroen Boydens Belgium
Hamid R. Zarandi Iran
Carles Hernández Spain
Antonio Miele Italy
Tiberiu Seceleanu Sweden
Jerry L. Trahan United States
Olaf Henniger Germany
Hyungmin Cho South Korea
Abhijit Davare United States
V.P. Nelson relative to Lin Huang China Lin Huang's profile →
Citations per field
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Citations per year

Countries citing papers authored by V.P. Nelson

Since Specialization
Citations

This map shows the geographic impact of V.P. Nelson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V.P. Nelson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V.P. Nelson more than expected).

Fields of papers citing papers by V.P. Nelson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V.P. Nelson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V.P. Nelson. The network helps show where V.P. Nelson may publish in the future.

Co-authors

The 24 scholars most cited alongside V.P. Nelson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V.P. Nelson Line = papers co-authored together V.P. Nelson links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1990235
2
Digital Logic Circuit Analysis and Design
199573
3 200330
4
Tutorial: fault-tolerant computing
198721
5 200217
6 200915
7 198111
8 20029
9 20118
10 20097
11 19805
12 20155
13
Test Development of a Microcontroller-Based MCM for Automotive Applications
19954
14 20024
15 19814
16 20144
17 19913
18 20043
19
Fault and Yield Modeling of MCMs for Automotive Applications
19962
20 19982

About V.P. Nelson

V.P. Nelson is a scholar working on Media Technology, Hardware and Architecture, Information Systems, Computer Networks and Communications and Electrical and Electronic Engineering, having authored 38 papers that have together received 480 indexed citations. Recurring topics across this work include Experimental Learning in Engineering (12 papers), Information Systems Education and Curriculum Development (8 papers), VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Interconnection Networks and Systems (5 papers), Petri Nets in System Modeling (3 papers), Engineering Education and Curriculum Development (3 papers) and Mechatronics Education and Applications (3 papers). The work is most often cited by research in Hardware and Architecture (188 citations), Software (54 citations), Computer Networks and Communications (166 citations), Safety, Risk, Reliability and Quality (41 citations) and Statistics, Probability and Uncertainty (28 citations). V.P. Nelson has collaborated with scholars based in United States, United Kingdom and China. Frequent co-authors include H. Troy Nagle, A.D. Singh, J. David Irwin, Charles E. Stroud, Chia-Jiu Wang, John Impagliazzo, John Y. Hung, Joseph L. Hughes, Jie Qin and Andrew McGettrick. Their work appears in journals such as IEEE Micro, Parallel Computing, IEEE Transactions on Reliability, IEEE Transactions on Computers and IEEE Journal of Solid-State Circuits.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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