V. Russo

446 citations
59 papers · 342 · h-index 9

Impact in

Papers in

V. Russo

52 papers receiving 309 citations

Peers

V. Russo
Comparison fields: 5 of 49
  • Surfaces, Coatings and Films 56
  • Atomic and Molecular Physics, and Optics 115
  • Electrical and Electronic Engineering 180
  • Aerospace Engineering 63
  • Media Technology 22
Replace Juan M. Simon with:
Juan M. Simon Argentina
Yangchun Cheng China
J. Hamasaki Japan
Richard N. Pfisterer United States
K. Moriwaki Japan
Michael Yeung United States
Ralf Steinkopf Germany
F.J. Tischer United States
Paul D. Atcheson United States
José A. Domínguez-Caballero United States
V. Russo relative to Juan M. Simon Argentina Juan M. Simon's profile →
Citations per field
00.5×1.5×1.9×
Juan M. Simon · 1×
Citations per year

Countries citing papers authored by V. Russo

Since Specialization
Citations

This map shows the geographic impact of V. Russo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Russo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Russo more than expected).

Fields of papers citing papers by V. Russo

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Russo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Russo. The network helps show where V. Russo may publish in the future.

Co-authors

The 25 scholars most cited alongside V. Russo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V. Russo Line = papers co-authored together V. Russo links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 59 papers — load more, or switch the sort, to bring in the rest.

#Work
1 197353
2 198434
3 197930
4 196830
5 197227
6 197115
7 197114
8 196811
9 197910
10 19857
11 19727
12 19855
13 20005
14 19995
15 19895
16
Thin film integrated signal processors
19775
17 19885
18 19595
19 19744
20 19804

About V. Russo

V. Russo is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Media Technology, having authored 59 papers that have together received 342 indexed citations. Recurring topics across this work include Photonic and Optical Devices (16 papers), Semiconductor Lasers and Optical Devices (11 papers), Advanced optical system design (11 papers), Photorefractive and Nonlinear Optics (10 papers), Optical Coatings and Gratings (9 papers), Advanced Optical Imaging Technologies (6 papers), Advanced Measurement and Metrology Techniques (6 papers) and Optical Coherence Tomography Applications (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (56 citations), Atomic and Molecular Physics, and Optics (115 citations), Electrical and Electronic Engineering (180 citations), Aerospace Engineering (63 citations) and Media Technology (22 citations). V. Russo has collaborated with scholars based in Italy, Mexico and Romania. Frequent co-authors include S. Sottini, Giancarlo C. Righini, G. Toraldo di Francia, Silvana Trigari, Giampaolo Papi, A. M. Scheggi, Roberta Ramponi, Roberto Osellame, Marco Marangoni and Girolamo Di Francia. Their work appears in journals such as Journal of Lightwave Technology, Lasers in Medical Science, Optics Communications, Proceedings of the IEEE and Ophthalmologica.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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