F.J. Tischer
Impact in
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- Microwave Engineering and Waveguides
- Photonic and Optical Devices
- Microwave and Dielectric Measurement Techniques
- Terahertz technology and applications
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- Gyrotron and Vacuum Electronics Research
Papers in
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- Microwave Engineering and Waveguides 23
- Photonic and Optical Devices 12
- Microwave and Dielectric Measurement Techniques 8
- Plasma Diagnostics and Applications 3
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- Gyrotron and Vacuum Electronics Research 7
- Electromagnetic Scattering and Analysis 3
- Co-authors
- F.A. Benson (3 shared papers)M. Cohn (1 shared paper)Peter Cudd (1 shared paper)Gerhard Fettweis (1 shared paper)H.Y. Yee (1 shared paper)
- Journals
- IEEE Transactions on Microwave Theory and Techniques (8 papers)Proceedings of the IEEE (6 papers)Electronics Letters (2 papers)Review of Scientific Instruments (1 paper)Surface Science (1 paper)
- Partner nations
- United StatesUnited KingdomGermany
In The Last Decade
F.J. Tischer
41 papers receiving 303 citations
Peers
Comparison fields: 5 of 41
- Electrical and Electronic Engineering 278
- Atomic and Molecular Physics, and Optics 124
- Aerospace Engineering 88
- Surfaces, Coatings and Films 20
- Astronomy and Astrophysics 28
Countries citing papers authored by F.J. Tischer
This map shows the geographic impact of F.J. Tischer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F.J. Tischer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F.J. Tischer more than expected).
Fields of papers citing papers by F.J. Tischer
This network shows the impact of papers produced by F.J. Tischer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F.J. Tischer. The network helps show where F.J. Tischer may publish in the future.
Co-authors
The 5 scholars most cited alongside F.J. Tischer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 46 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1963 | 66 | |
| 2 | 1976 | 40 | |
| 3 | 1979 | 38 | |
| 4 | 1957 | 21 | |
| 5 | 1970 | 17 | |
| 6 | 1959 | 15 | |
| 7 | 1984 | 10 | |
| 8 | 1960 | 10 | |
| 9 | 1960 | 9 | |
| 10 | 1974 | 9 | |
| 11 | 1974 | 9 | |
| 12 | 1970 | 9 | |
| 13 | 1984 | 8 | |
| 14 | 1963 | 8 | |
| 15 | 1971 | 6 | |
| 16 | 1958 | 6 | |
| 17 | 1975 | 5 | |
| 18 | 1974 | 5 | |
| 19 | 1974 | 5 | |
| 20 | 1959 | 5 |
About F.J. Tischer
F.J. Tischer is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Aerospace Engineering, Electronic, Optical and Magnetic Materials and Computer Networks and Communications, having authored 46 papers that have together received 349 indexed citations. Recurring topics across this work include Microwave Engineering and Waveguides (23 papers), Photonic and Optical Devices (12 papers), Microwave and Dielectric Measurement Techniques (8 papers), Gyrotron and Vacuum Electronics Research (7 papers), Advanced Antenna and Metasurface Technologies (7 papers), Copper Interconnects and Reliability (5 papers), Electromagnetic Scattering and Analysis (3 papers) and Plasma Diagnostics and Applications (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (278 citations), Atomic and Molecular Physics, and Optics (124 citations), Aerospace Engineering (88 citations), Surfaces, Coatings and Films (20 citations) and Astronomy and Astrophysics (28 citations). F.J. Tischer has collaborated with scholars based in United States, United Kingdom and Germany. Frequent co-authors include F.A. Benson, M. Cohn, Peter Cudd, Gerhard Fettweis and H.Y. Yee. Their work appears in journals such as IEEE Transactions on Microwave Theory and Techniques, Proceedings of the IEEE, Electronics Letters, Review of Scientific Instruments and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.