V. Dattilo
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
Papers in
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- Electronic Packaging and Soldering Technologies 7
- Semiconductor materials and devices 6
- Electromagnetic Compatibility and Noise Suppression 4
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- Copper Interconnects and Reliability 7
- Co-authors
- Bruno Neri (10 shared papers)C. Ciofi (9 shared papers)R. Giannetti (1 shared paper)A. Mathewson (2 shared papers)Sean Foley (2 shared papers)A. Diligenti (1 shared paper)A. Nannini (1 shared paper)Paolo Bruschi (1 shared paper)
- Journals
- Microelectronics Reliability (4 papers)Journal of Electronic Materials (1 paper)Physics Letters A (1 paper)IEEE Transactions on Instrumentation and Measurement (1 paper)IEEE Transactions on Electron Devices (1 paper)
- Partner nations
- ItalyUnited StatesIreland
In The Last Decade
V. Dattilo
14 papers receiving 89 citations
Peers
Comparison fields: 5 of 29
- Electronic, Optical and Magnetic Materials 40
- Electrical and Electronic Engineering 77
- Atomic and Molecular Physics, and Optics 33
- Bioengineering 2
- Astronomy and Astrophysics 5
Countries citing papers authored by V. Dattilo
This map shows the geographic impact of V. Dattilo's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Dattilo with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Dattilo more than expected).
Fields of papers citing papers by V. Dattilo
This network shows the impact of papers produced by V. Dattilo. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Dattilo. The network helps show where V. Dattilo may publish in the future.
Co-authors
The 25 scholars most cited alongside V. Dattilo, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 35 | |
| 2 | 1998 | 23 | |
| 3 | 1999 | 7 | |
| 4 | 2000 | 6 | |
| 5 | 1997 | 4 | |
| 6 | 2002 | 4 | |
| 7 | 2003 | 4 | |
| 8 | 2020 | 3 | |
| 9 | 1997 | 3 | |
| 10 | 1996 | 3 | |
| 11 | 1999 | 3 | |
| 12 | 2006 | 1 | |
| 13 | 2002 | 1 | |
| 14 | Open Questions on Noise in Metal Lines Subjected to High Current Densities | 1999 | 1 |
| 15 | 2023 | 0 |
About V. Dattilo
V. Dattilo is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Astronomy and Astrophysics, Ocean Engineering and Oceanography, having authored 15 papers that have together received 98 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (7 papers), Copper Interconnects and Reliability (7 papers), Semiconductor materials and devices (6 papers), Pulsars and Gravitational Waves Research (5 papers), Electromagnetic Compatibility and Noise Suppression (4 papers), Geophysics and Sensor Technology (3 papers), Geophysics and Gravity Measurements (2 papers) and Seismic Waves and Analysis (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (40 citations), Electrical and Electronic Engineering (77 citations), Atomic and Molecular Physics, and Optics (33 citations), Bioengineering (2 citations) and Astronomy and Astrophysics (5 citations). V. Dattilo has collaborated with scholars based in Italy, United States and Ireland. Frequent co-authors include Bruno Neri, C. Ciofi, R. Giannetti, A. Mathewson, Sean Foley, A. Diligenti, A. Nannini, Paolo Bruschi, V. Boschi and A. Gennai. Their work appears in journals such as Microelectronics Reliability, Journal of Electronic Materials, Physics Letters A, IEEE Transactions on Instrumentation and Measurement and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.