Thomas Tondu
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 10%
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Plasma Diagnostics and Applications 8
- Electrohydrodynamics and Fluid Dynamics 5
- Semiconductor materials and devices 5
-
- Electron and X-Ray Spectroscopy Techniques 6
- Co-authors
- Mohamed Belhaj (8 shared papers)Virginie Inguimbert (7 shared papers)D. Payan (1 shared paper)N. Balcon (1 shared paper)Jean‐François Roussel (8 shared papers)Delphine Faye (4 shared papers)O. Jbara (2 shared papers)Jean-Charles Matéo‐Vélez (2 shared papers)
In The Last Decade
Thomas Tondu
19 papers receiving 297 citations
Peers
Comparison fields: 5 of 35
- Surfaces, Coatings and Films 142
- Radiation 37
- Electrical and Electronic Engineering 221
- Aerospace Engineering 58
- Computational Mechanics 43
Countries citing papers authored by Thomas Tondu
This map shows the geographic impact of Thomas Tondu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Tondu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Tondu more than expected).
Fields of papers citing papers by Thomas Tondu
This network shows the impact of papers produced by Thomas Tondu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Tondu. The network helps show where Thomas Tondu may publish in the future.
Co-authors
The 16 scholars most cited alongside Thomas Tondu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 114 | |
| 2 | 2009 | 26 | |
| 3 | 2011 | 20 | |
| 4 | 2010 | 20 | |
| 5 | 2008 | 18 | |
| 6 | 2009 | 17 | |
| 7 | 2011 | 14 | |
| 8 | 2013 | 14 | |
| 9 | 2010 | 13 | |
| 10 | 2016 | 11 | |
| 11 | 2016 | 9 | |
| 12 | 2011 | 9 | |
| 13 | 2008 | 8 | |
| 14 | 2016 | 8 | |
| 15 | Sputtering yield of potential ceramics for Hall Eff ect Thruster discharge channel | 2011 | 3 |
| 16 | Angular Characterisation of Erosion and Contamination by Electric Propulsion | 2004 | 3 |
| 17 | 2008 | 3 | |
| 18 | 2011 | 2 | |
| 19 | ONERA ion erosion and contamination tests and their application to Astrium PPS modelling tool | 2003 | 1 |
About Thomas Tondu
Thomas Tondu is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Computational Mechanics, Mechanics of Materials and Materials Chemistry, having authored 19 papers that have together received 313 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (8 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Electrohydrodynamics and Fluid Dynamics (5 papers), Ion-surface interactions and analysis (5 papers), Semiconductor materials and devices (5 papers), Metal and Thin Film Mechanics (2 papers), Diamond and Carbon-based Materials Research (2 papers) and Recycling and Waste Management Techniques (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (142 citations), Radiation (37 citations), Electrical and Electronic Engineering (221 citations), Aerospace Engineering (58 citations) and Computational Mechanics (43 citations). Thomas Tondu has collaborated with scholars based in France and Tunisia. Frequent co-authors include Mohamed Belhaj, Virginie Inguimbert, D. Payan, N. Balcon, Jean‐François Roussel, Delphine Faye, O. Jbara, Jean-Charles Matéo‐Vélez, J. Puech and Pierre Barroy. Their work appears in journals such as Journal of Spacecraft and Rockets, Journal of Physics D Applied Physics, IEEE Transactions on Plasma Science, Journal of Applied Physics and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.