Thomas Längle
Impact in
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- Industrial Vision Systems and Defect Detection
- Recycling and Waste Management Techniques
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- Image and Object Detection Techniques
- Optical measurement and interference techniques
Papers in
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- Optical measurement and interference techniques 13
- Image and Object Detection Techniques 11
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- Optical Polarization and Ellipsometry 10
- Co-authors
- Jürgen Beyerer (69 shared papers)Robin Gruna (39 shared papers)Georg Maier (34 shared papers)Heinz Wörn (7 shared papers)Florian Pfaff (23 shared papers)Uwe D. Hanebeck (24 shared papers)Michael Heizmann (8 shared papers)Benjamin Noack (16 shared papers)
- Journals
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (3 papers)Powder Technology (3 papers)Applied Optics (3 papers)tm - Technisches Messen (20 papers)Sensors (2 papers)
- Partner nations
- GermanyUnited KingdomSwitzerland
In The Last Decade
Thomas Längle
90 papers receiving 445 citations
Peers
Comparison fields: 5 of 90
- Industrial and Manufacturing Engineering 86
- Computer Vision and Pattern Recognition 112
- Analytical Chemistry 44
- Industrial and Manufacturing Engineering 39
- Biophysics 23
Countries citing papers authored by Thomas Längle
This map shows the geographic impact of Thomas Längle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Längle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Längle more than expected).
Fields of papers citing papers by Thomas Längle
This network shows the impact of papers produced by Thomas Längle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Längle. The network helps show where Thomas Längle may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Längle, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 99 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 22 | |
| 2 | 2020 | 22 | |
| 3 | 2016 | 19 | |
| 4 | 2018 | 19 | |
| 5 | 2001 | 18 | |
| 6 | 2003 | 18 | |
| 7 | 2015 | 18 | |
| 8 | 2024 | 15 | |
| 9 | 2021 | 14 | |
| 10 | 2019 | 14 | |
| 11 | 2020 | 12 | |
| 12 | 2017 | 12 | |
| 13 | 2017 | 11 | |
| 14 | 2016 | 11 | |
| 15 | 2019 | 11 | |
| 16 | 2016 | 11 | |
| 17 | 2019 | 10 | |
| 18 | 2017 | 9 | |
| 19 | 2015 | 9 | |
| 20 | 2024 | 8 |
About Thomas Längle
Thomas Längle is a scholar working on Computer Vision and Pattern Recognition, Biomedical Engineering, Industrial and Manufacturing Engineering, Mechanical Engineering and Computational Mechanics, having authored 99 papers that have together received 461 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (19 papers), Spectroscopy and Chemometric Analyses (13 papers), Optical measurement and interference techniques (13 papers), Image and Object Detection Techniques (11 papers), Mineral Processing and Grinding (11 papers), Optical Polarization and Ellipsometry (10 papers), Modular Robots and Swarm Intelligence (10 papers) and Surface Roughness and Optical Measurements (9 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (86 citations), Computer Vision and Pattern Recognition (112 citations), Analytical Chemistry (44 citations), Industrial and Manufacturing Engineering (39 citations) and Biophysics (23 citations). Thomas Längle has collaborated with scholars based in Germany, United Kingdom and Switzerland. Frequent co-authors include Jürgen Beyerer, Robin Gruna, Georg Maier, Heinz Wörn, Florian Pfaff, Uwe D. Hanebeck, Michael Heizmann, Benjamin Noack, Harald Kruggel‐Emden and S. Wirtz. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Powder Technology, Applied Optics, tm - Technisches Messen and Sensors.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.