Thomas Längle
Impact in
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- Industrial Vision Systems and Defect Detection
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- Image and Object Detection Techniques
- Optical measurement and interference techniques
Papers in
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- Optical measurement and interference techniques 11
- Image and Object Detection Techniques 10
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- Optical Polarization and Ellipsometry 10
- Advanced Chemical Sensor Technologies 8
- Co-authors
- Jürgen Beyerer (63 shared papers)Robin Gruna (36 shared papers)Georg Maier (31 shared papers)Uwe D. Hanebeck (23 shared papers)Florian Pfaff (22 shared papers)Heinz Wörn (6 shared papers)Benjamin Noack (15 shared papers)Harald Kruggel‐Emden (21 shared papers)
- Journals
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (3 papers)Powder Technology (3 papers)Applied Optics (3 papers)tm - Technisches Messen (20 papers)Sensors (2 papers)
- Partner nations
- GermanyUnited KingdomSwitzerland
In The Last Decade
Thomas Längle
78 papers receiving 387 citations
Peers
Comparison fields: 5 of 83
- Industrial and Manufacturing Engineering 66
- Computer Vision and Pattern Recognition 100
- Analytical Chemistry 41
- Industrial and Manufacturing Engineering 34
- Biophysics 22
Countries citing papers authored by Thomas Längle
This map shows the geographic impact of Thomas Längle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Längle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Längle more than expected).
Fields of papers citing papers by Thomas Längle
This network shows the impact of papers produced by Thomas Längle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Längle. The network helps show where Thomas Längle may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Längle, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 86 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 20 | |
| 2 | 2016 | 19 | |
| 3 | 2018 | 18 | |
| 4 | 2015 | 16 | |
| 5 | 2001 | 15 | |
| 6 | 2004 | 15 | |
| 7 | 2024 | 15 | |
| 8 | 2019 | 14 | |
| 9 | 2021 | 13 | |
| 10 | 2020 | 12 | |
| 11 | 2003 | 11 | |
| 12 | 2017 | 11 | |
| 13 | 2016 | 11 | |
| 14 | 2017 | 10 | |
| 15 | 2016 | 10 | |
| 16 | 2019 | 10 | |
| 17 | 2019 | 10 | |
| 18 | 2015 | 9 | |
| 19 | 2024 | 8 | |
| 20 | 2022 | 8 |
About Thomas Längle
Thomas Längle is a scholar working on Computer Vision and Pattern Recognition, Biomedical Engineering, Industrial and Manufacturing Engineering, Mechanical Engineering and Computational Mechanics, having authored 86 papers that have together received 399 indexed citations. Recurring topics across this work include Industrial Vision Systems and Defect Detection (16 papers), Spectroscopy and Chemometric Analyses (13 papers), Optical measurement and interference techniques (11 papers), Image and Object Detection Techniques (10 papers), Optical Polarization and Ellipsometry (10 papers), Mineral Processing and Grinding (10 papers), Surface Roughness and Optical Measurements (9 papers) and Advanced Chemical Sensor Technologies (8 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (66 citations), Computer Vision and Pattern Recognition (100 citations), Analytical Chemistry (41 citations), Industrial and Manufacturing Engineering (34 citations) and Biophysics (22 citations). Thomas Längle has collaborated with scholars based in Germany, United Kingdom and Switzerland. Frequent co-authors include Jürgen Beyerer, Robin Gruna, Georg Maier, Uwe D. Hanebeck, Florian Pfaff, Heinz Wörn, Benjamin Noack, Harald Kruggel‐Emden, Christoph Pieper and S. Wirtz. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Powder Technology, Applied Optics, tm - Technisches Messen and Sensors.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.