Jürgen Beyerer

5.8k citations
422 papers · 3.5k · h-index 29

Impact in

Papers in

    • Video Surveillance and Tracking Methods 55
    • Advanced Neural Network Applications 47
    • Optical measurement and interference techniques 41
    • Advanced Vision and Imaging 29
    • Human Pose and Action Recognition 23
    • Anomaly Detection Techniques and Applications 23

Jürgen Beyerer

386 papers receiving 3.4k citations

Peers

Jürgen Beyerer
Comparison fields: 5 of 141
  • Computer Vision and Pattern Recognition 1.9k
  • Industrial and Manufacturing Engineering 501
  • Media Technology 238
  • Human-Computer Interaction 141
  • Geology 134
Replace Αντώνιος Γαστεράτος with:
Αντώνιος Γαστεράτος Greece
Qinggang Meng United Kingdom
Jia Pan Hong Kong
Huimin Ma China
Xin Ning China
Jiachen Yang China
Chen Feng United States
De Xu China
Hai Wang China
Lu Yu China
Jürgen Beyerer relative to Αντώνιος Γαστεράτος Greece Αντώνιος Γαστεράτος's profile →
Citations per field
00.5×1.5×
Αντώνιος Γαστεράτος · 1×
Citations per year

Countries citing papers authored by Jürgen Beyerer

Since Specialization
Citations

This map shows the geographic impact of Jürgen Beyerer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jürgen Beyerer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jürgen Beyerer more than expected).

Fields of papers citing papers by Jürgen Beyerer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jürgen Beyerer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jürgen Beyerer. The network helps show where Jürgen Beyerer may publish in the future.

Co-authors

The 25 scholars most cited alongside Jürgen Beyerer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jürgen Beyerer Line = papers co-authored together Jürgen Beyerer links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 422 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2018102
2 201795
3 201789
4 202188
5 201376
6 201469
7 201566
8 202257
9 201156
10 201656
11 202352
12 201545
13 200945
14 201545
15 201842
16 202139
17 202039
18 201738
19 201838
20 201937

About Jürgen Beyerer

Jürgen Beyerer is a scholar working on Computer Vision and Pattern Recognition, Artificial Intelligence, Industrial and Manufacturing Engineering, Computational Mechanics and Control and Systems Engineering, having authored 422 papers that have together received 3.5k indexed citations. Recurring topics across this work include Video Surveillance and Tracking Methods (55 papers), Advanced Neural Network Applications (47 papers), Optical measurement and interference techniques (41 papers), Industrial Vision Systems and Defect Detection (30 papers), Advanced Vision and Imaging (29 papers), Robotics and Sensor-Based Localization (24 papers), Human Pose and Action Recognition (23 papers) and Anomaly Detection Techniques and Applications (23 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (1.9k citations), Industrial and Manufacturing Engineering (501 citations), Media Technology (238 citations), Human-Computer Interaction (141 citations) and Geology (134 citations). Jürgen Beyerer has collaborated with scholars based in Germany, Taiwan and United States. Frequent co-authors include Lars Sommer, Tobias Schuchert, Daniel Stadler, Arne Schumann, Christian Frese, Julius Pfrommer, Fernando Puente León, Thomas Längle, Michael Teutsch and Christian Herrmann. Their work appears in journals such as Sensors, tm - Technisches Messen, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Measurement and Applied Optics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact