Th. Kups
Impact in
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- Gas Sensing Nanomaterials and Sensors
- Thin-Film Transistor Technologies
- Semiconductor materials and devices
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- ZnO doping and properties
- Electronic and Structural Properties of Oxides
Papers in
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- GaN-based semiconductor devices and materials 3
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- Gas Sensing Nanomaterials and Sensors 3
- Semiconductor materials and devices 2
- Silicon Carbide Semiconductor Technologies 2
- Electrophoretic Deposition in Materials Science 1
- Co-authors
- V. Cimalla (8 shared papers)O. Ambacher (8 shared papers)Ch. Y. Wang (8 shared papers)Jörg Pezoldt (4 shared papers)Th. Stauden (4 shared papers)Peter Schaaf (3 shared papers)C.‐C. Röhlig (3 shared papers)Bo Lü (1 shared paper)
In The Last Decade
Th. Kups
14 papers receiving 544 citations
Peers
Comparison fields: 5 of 27
- Electrical and Electronic Engineering 284
- Materials Chemistry 206
- Electronic, Optical and Magnetic Materials 74
- Condensed Matter Physics 50
- General Materials Science 7
Countries citing papers authored by Th. Kups
This map shows the geographic impact of Th. Kups's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Th. Kups with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Th. Kups more than expected).
Fields of papers citing papers by Th. Kups
This network shows the impact of papers produced by Th. Kups. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Th. Kups. The network helps show where Th. Kups may publish in the future.
Co-authors
The 25 scholars most cited alongside Th. Kups, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2008 | 121 | |
| 2 | 2006 | 92 | |
| 3 | 2007 | 75 | |
| 4 | 2007 | 61 | |
| 5 | 2014 | 48 | |
| 6 | 2016 | 31 | |
| 7 | 2007 | 30 | |
| 8 | 2007 | 28 | |
| 9 | 2007 | 24 | |
| 10 | 2011 | 15 | |
| 11 | 2002 | 9 | |
| 12 | 2008 | 8 | |
| 13 | 2007 | 7 | |
| 14 | 2007 | 1 |
About Th. Kups
Th. Kups is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Materials Chemistry, Computational Mechanics and Electronic, Optical and Magnetic Materials, having authored 14 papers that have together received 550 indexed citations. Recurring topics across this work include Electronic and Structural Properties of Oxides (3 papers), Gas Sensing Nanomaterials and Sensors (3 papers), GaN-based semiconductor devices and materials (3 papers), Semiconductor materials and devices (2 papers), Silicon Carbide Semiconductor Technologies (2 papers), Fluid Dynamics and Thin Films (2 papers), Electrophoretic Deposition in Materials Science (1 paper) and MXene and MAX Phase Materials (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (284 citations), Materials Chemistry (206 citations), Electronic, Optical and Magnetic Materials (74 citations), Condensed Matter Physics (50 citations) and General Materials Science (7 citations). Th. Kups has collaborated with scholars based in Germany, Spain and China. Frequent co-authors include V. Cimalla, O. Ambacher, Ch. Y. Wang, Jörg Pezoldt, Th. Stauden, Peter Schaaf, C.‐C. Röhlig, Bo Lü, Ye Dai and H. Romanus. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, physica status solidi (a), Sensors and Actuators B Chemical and AIP Advances.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.