Ted Liang
Impact in
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Photolithography Techniques 48
- Integrated Circuits and Semiconductor Failure Analysis 31
- Semiconductor materials and devices 3
- Plasma Diagnostics and Applications 2
-
- Electron and X-Ray Spectroscopy Techniques 45
- Co-authors
- Alan R. Stivers (17 shared papers)Guojing Zhang (16 shared papers)Pei-yang Yan (7 shared papers)Richard H. Livengood (3 shared papers)Philip D. Rack (1 shared paper)Jeong Young Park (3 shared papers)Gábor A. Somorjai (3 shared papers)Edita Tejnil (4 shared papers)
- Journals
- Journal of The Electrochemical Society (1 paper)Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)Journal of Applied Physics (1 paper)Microelectronic Engineering (1 paper)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (1 paper)
- Partner nations
- United StatesJapanUnited Kingdom
In The Last Decade
Ted Liang
50 papers receiving 663 citations
Peers
Comparison fields: 5 of 38
- Structural Biology 105
- Surfaces, Coatings and Films 452
- Electrical and Electronic Engineering 593
- Radiation 57
- Computational Mechanics 139
Countries citing papers authored by Ted Liang
This map shows the geographic impact of Ted Liang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ted Liang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ted Liang more than expected).
Fields of papers citing papers by Ted Liang
This network shows the impact of papers produced by Ted Liang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ted Liang. The network helps show where Ted Liang may publish in the future.
Co-authors
The 25 scholars most cited alongside Ted Liang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 51 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 71 | |
| 2 | 2016 | 61 | |
| 3 | 2000 | 49 | |
| 4 | 2008 | 43 | |
| 5 | 2002 | 37 | |
| 6 | 2009 | 31 | |
| 7 | 2007 | 27 | |
| 8 | 2001 | 20 | |
| 9 | 2000 | 19 | |
| 10 | 2004 | 19 | |
| 11 | 2004 | 17 | |
| 12 | 2007 | 16 | |
| 13 | 2006 | 16 | |
| 14 | 2003 | 16 | |
| 15 | 2008 | 14 | |
| 16 | 2006 | 14 | |
| 17 | 2007 | 13 | |
| 18 | 2015 | 13 | |
| 19 | 2010 | 13 | |
| 20 | 2008 | 13 |
About Ted Liang
Ted Liang is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Industrial and Manufacturing Engineering, Mechanical Engineering and Biomedical Engineering, having authored 51 papers that have together received 720 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (48 papers), Electron and X-Ray Spectroscopy Techniques (45 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers), Industrial Vision Systems and Defect Detection (4 papers), Welding Techniques and Residual Stresses (3 papers), Semiconductor materials and devices (3 papers), Advanced Electron Microscopy Techniques and Applications (2 papers) and Plasma Diagnostics and Applications (2 papers). The work is most often cited by research in Structural Biology (105 citations), Surfaces, Coatings and Films (452 citations), Electrical and Electronic Engineering (593 citations), Radiation (57 citations) and Computational Mechanics (139 citations). Ted Liang has collaborated with scholars based in United States, Japan and United Kingdom. Frequent co-authors include Alan R. Stivers, Guojing Zhang, Pei-yang Yan, Richard H. Livengood, Philip D. Rack, Jeong Young Park, Gábor A. Somorjai, Edita Tejnil, T. Shimomura and Leonid Belau. Their work appears in journals such as Journal of The Electrochemical Society, Journal of Micro/Nanolithography MEMS and MOEMS, Journal of Applied Physics, Microelectronic Engineering and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.