T. H. Eickhoff
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
-
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 8
-
- Silicon and Solar Cell Technologies 11
- Advanced Semiconductor Detectors and Materials 2
- Semiconductor materials and devices 1
- Co-authors
- W. Drube (11 shared papers)Leif I. Johansson (6 shared papers)Wolfgang Theiß (3 shared papers)Peter Große (3 shared papers)Charíya Virojanadara (4 shared papers)V. R. R. Medicherla (1 shared paper)H. Wagner (10 shared papers)Dietrich R. T. Zahn (5 shared papers)
- Journals
- Applied Surface Science (4 papers)Surface Science (3 papers)Journal of Non-Crystalline Solids (2 papers)Physical Review Letters (1 paper)Vacuum (1 paper)
- Partner nations
- GermanySwedenUnited Kingdom
In The Last Decade
T. H. Eickhoff
31 papers receiving 388 citations
Peers
Comparison fields: 5 of 31
- Surfaces, Coatings and Films 90
- Radiation 32
- Electrical and Electronic Engineering 194
- Materials Chemistry 91
- Atomic and Molecular Physics, and Optics 53
Countries citing papers authored by T. H. Eickhoff
This map shows the geographic impact of T. H. Eickhoff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. H. Eickhoff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. H. Eickhoff more than expected).
Fields of papers citing papers by T. H. Eickhoff
This network shows the impact of papers produced by T. H. Eickhoff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. H. Eickhoff. The network helps show where T. H. Eickhoff may publish in the future.
Co-authors
The 25 scholars most cited alongside T. H. Eickhoff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 46 | |
| 2 | 2002 | 41 | |
| 3 | 2004 | 41 | |
| 4 | 2003 | 38 | |
| 5 | 1990 | 36 | |
| 6 | 2001 | 23 | |
| 7 | 2005 | 18 | |
| 8 | 1996 | 17 | |
| 9 | 1990 | 15 | |
| 10 | 1992 | 14 | |
| 11 | 1992 | 13 | |
| 12 | 1999 | 13 | |
| 13 | 1992 | 12 | |
| 14 | 1997 | 11 | |
| 15 | 2002 | 11 | |
| 16 | 1990 | 9 | |
| 17 | 1997 | 7 | |
| 18 | 1990 | 6 | |
| 19 | 1993 | 5 | |
| 20 | 1996 | 5 |
About T. H. Eickhoff
T. H. Eickhoff is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Radiation, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 31 papers that have together received 401 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (11 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Semiconductor materials and interfaces (4 papers), Silicon Nanostructures and Photoluminescence (2 papers), X-ray Spectroscopy and Fluorescence Analysis (2 papers), Advanced Semiconductor Detectors and Materials (2 papers), Surface Roughness and Optical Measurements (1 paper) and Semiconductor materials and devices (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (90 citations), Radiation (32 citations), Electrical and Electronic Engineering (194 citations), Materials Chemistry (91 citations) and Atomic and Molecular Physics, and Optics (53 citations). T. H. Eickhoff has collaborated with scholars based in Germany, Sweden and United Kingdom. Frequent co-authors include W. Drube, Leif I. Johansson, Wolfgang Theiß, Peter Große, Charíya Virojanadara, V. R. R. Medicherla, H. Wagner, Dietrich R. T. Zahn, C. Beneking and W. Richter. Their work appears in journals such as Applied Surface Science, Surface Science, Journal of Non-Crystalline Solids, Physical Review Letters and Vacuum.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.