Stephan Waldner

437 citations
13 papers · 311 · h-index 6

Impact in

Papers in

Stephan Waldner

12 papers receiving 285 citations

Peers

Stephan Waldner
Comparison fields: 5 of 28
  • Computer Vision and Pattern Recognition 265
  • Media Technology 110
  • Atomic and Molecular Physics, and Optics 119
  • Mechanical Engineering 89
  • Computational Mechanics 45
Replace Vít Lédl with:
Vít Lédl Czechia
Guillermo Garnica Mexico
Ricardo Legarda-Sáenz Mexico
Moisés Padilla Mexico
Yongfu Wen China
Gerhard Kupfer Germany
C. Forno United Kingdom
Reinhold Ritter Germany
Lars Benckert Sweden
Yongmo Zhuo China
Stephan Waldner relative to Vít Lédl Czechia Vít Lédl's profile →
Citations per field
00.5×1.5×
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Citations per year

Countries citing papers authored by Stephan Waldner

Since Specialization
Citations

This map shows the geographic impact of Stephan Waldner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Stephan Waldner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Stephan Waldner more than expected).

Fields of papers citing papers by Stephan Waldner

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Stephan Waldner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Stephan Waldner. The network helps show where Stephan Waldner may publish in the future.

Co-authors

The 5 scholars most cited alongside Stephan Waldner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Stephan Waldner Line = papers co-authored together Stephan Waldner links everyone, so they are left out of the graph.

All Works

13 of 13 papers shown
#Work
1 1999199
2 199754
3 199618
4 199912
5 19968
6 20106
7 20134
8 19973
9 20243
10 20212
11 20111
12 20191
13 20250

About Stephan Waldner

Stephan Waldner is a scholar working on Mechanical Engineering, Electrical and Electronic Engineering, Computer Vision and Pattern Recognition, Computational Mechanics and Surfaces, Coatings and Films, having authored 13 papers that have together received 311 indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (7 papers), Optical measurement and interference techniques (6 papers), Surface Roughness and Optical Measurements (4 papers), Optical Coatings and Gratings (4 papers), Advanced Measurement and Detection Methods (2 papers), Thin-Film Transistor Technologies (2 papers), Advanced Fiber Optic Sensors (1 paper) and Silicone and Siloxane Chemistry (1 paper). The work is most often cited by research in Computer Vision and Pattern Recognition (265 citations), Media Technology (110 citations), Atomic and Molecular Physics, and Optics (119 citations), Mechanical Engineering (89 citations) and Computational Mechanics (45 citations). Stephan Waldner has collaborated with scholars based in Switzerland and Poland. Frequent co-authors include Małgorzata Kujawińska, Thomas Frei, Xavier Maeder, Amit Kumar Sharma and Tijmen Vermeij. Their work appears in journals such as Optics Communications, Journal of the European Optical Society Rapid Publications, Chinese Optics Letters, Optics and Lasers in Engineering and SHILAP Revista de lepidopterología.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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