Scott E. Sills

24 papers receiving 690 citations

Peers

Scott E. Sills
Comparison fields: 5 of 28
  • Electrical and Electronic Engineering 395
  • Atomic and Molecular Physics, and Optics 151
  • Mechanics of Materials 68
  • Surfaces, Coatings and Films 15
  • Hardware and Architecture 17
Replace W. M. Tong with:
W. M. Tong United States
Yi Zhao China
Ivan K. Pollentier Belgium
Borna J. Obradovic United States
Pragya Rasmi Shrestha United States
Raymond A. Cirelli United States
D. L. Hedden United States
Y. S. Liu United States
Jinjuan Xiang China
Mark Doczy United States
Scott E. Sills relative to W. M. Tong United States W. M. Tong's profile →
Citations per field
00.5×2×4×6×8.5×
W. M. Tong · 1×
Citations per year

Countries citing papers authored by Scott E. Sills

Since Specialization
Citations

This map shows the geographic impact of Scott E. Sills's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scott E. Sills with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scott E. Sills more than expected).

Fields of papers citing papers by Scott E. Sills

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Scott E. Sills. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scott E. Sills. The network helps show where Scott E. Sills may publish in the future.

Co-authors

The 25 scholars most cited alongside Scott E. Sills, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Scott E. Sills Line = papers co-authored together Scott E. Sills links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2003106
2 201594
3 200463
4 201457
5 201452
6 200546
7 201444
8 201537
9 200636
10 201436
11 201634
12 201517
13 201514
14 200713
15 201513
16 200511
17 201810
18 20059
19 20157
20 20066

About Scott E. Sills

Scott E. Sills is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Mechanics of Materials, Biophysics and Atomic and Molecular Physics, and Optics, having authored 24 papers that have together received 712 indexed citations. Recurring topics across this work include Advanced Memory and Neural Computing (12 papers), Material Dynamics and Properties (6 papers), Metal and Thin Film Mechanics (2 papers), Advanced Materials and Mechanics (2 papers), Force Microscopy Techniques and Applications (2 papers), Semiconductor materials and devices (1 paper), Nanopore and Nanochannel Transport Studies (1 paper) and Advanced biosensing and bioanalysis techniques (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (395 citations), Atomic and Molecular Physics, and Optics (151 citations), Mechanics of Materials (68 citations), Surfaces, Coatings and Films (15 citations) and Hardware and Architecture (17 citations). Scott E. Sills has collaborated with scholars based in United States, Italy and Japan. Frequent co-authors include René M. Overney, Alessandro Calderoni, Nirmal Ramaswamy, Zhongqiang Wang, Stefano Ambrogio, Daniele Ielmini, Simone Balatti, Jane Frommer, Tomoko O. Gray and Katsuhisa Aratani. Their work appears in journals such as The Journal of Chemical Physics, IEEE Transactions on Electron Devices, Journal of Adhesion Science and Technology, Physical Review Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact