S. Patil

1.2k citations
20 papers · 791 · h-index 12

Impact in

    • VLSI and Analog Circuit Testing
    • Physical Unclonable Functions (PUFs) and Hardware Security
  • Software top 5%
    • Software Testing and Debugging Techniques

Papers in

    • Integrated Circuits and Semiconductor Failure Analysis 17
    • Radiation Effects in Electronics 6
    • VLSI and FPGA Design Techniques 3
    • Advancements in Photolithography Techniques 2
    • VLSI and Analog Circuit Testing 17
    • Physical Unclonable Functions (PUFs) and Hardware Security 3

S. Patil

17 papers receiving 747 citations

Peers

S. Patil
Comparison fields: 5 of 18
  • Hardware and Architecture 772
  • Software 58
  • Electrical and Electronic Engineering 736
  • Control and Systems Engineering 89
  • Computer Networks and Communications 38
Replace Kohei Miyase with:
Kohei Miyase Japan
L.M. Huisman United States
F. P. M. Beenker Netherlands
Savir United States
Andreas Glowatz Germany
Mahesh A. Iyer United States
Friedrich Hapke Germany
Sergei Devadze Estonia
E. Ulrich United States
H.-K.T. Ma United States
S. Patil relative to Kohei Miyase Japan Kohei Miyase's profile →
Citations per field
00.5×2.5×
Kohei Miyase · 1×
Citations per year

Countries citing papers authored by S. Patil

Since Specialization
Citations

This map shows the geographic impact of S. Patil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Patil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Patil more than expected).

Fields of papers citing papers by S. Patil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Patil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Patil. The network helps show where S. Patil may publish in the future.

Co-authors

The 13 scholars most cited alongside S. Patil, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Patil Line = papers co-authored together S. Patil links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 1994191
2 1993150
3 2002120
4 199056
5 200546
6 199143
7 200238
8 199435
9 199630
10 198919
11 198914
12 200311
13 201210
14 20039
15 20069
16 20058
17 20061
18 20091
19 20240
20 20050

About S. Patil

S. Patil is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Control and Systems Engineering, Molecular Biology and Computational Theory and Mathematics, having authored 20 papers that have together received 791 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (17 papers), VLSI and Analog Circuit Testing (17 papers), Radiation Effects in Electronics (6 papers), Physical Unclonable Functions (PUFs) and Hardware Security (3 papers), VLSI and FPGA Design Techniques (3 papers), Engineering and Test Systems (2 papers), Advancements in Photolithography Techniques (2 papers) and Quantum-Dot Cellular Automata (1 paper). The work is most often cited by research in Hardware and Architecture (772 citations), Software (58 citations), Electrical and Electronic Engineering (736 citations), Control and Systems Engineering (89 citations) and Computer Networks and Communications (38 citations). S. Patil has collaborated with scholars based in United States. Frequent co-authors include J. Savir, P. Banerjee, T.W. Williams, T.J. Snethen, R. Kapur, Constantine D. Polychronopoulos, S.M. Reddy, S. Chakravarty, Nur A. Touba and Naghmeh Karimi. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, International Journal of Research in Agronomy and IEEE Design & Test of Computers.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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