S. Daiser

488 citations
14 papers · 408 · h-index 9

Impact in

Papers in

S. Daiser

14 papers receiving 386 citations

Peers

S. Daiser
Comparison fields: 5 of 42
  • Surfaces, Coatings and Films 65
  • Atomic and Molecular Physics, and Optics 234
  • Electronic, Optical and Magnetic Materials 131
  • Atmospheric Science 120
  • Electrochemistry 40
Replace K. Stahrenberg with:
K. Stahrenberg Germany
T. Bornemann Germany
A. J. Schell-Sorokin United States
W. Wallauer Germany
A. Bettac Germany
M. Salvietti Italy
Christoph Romainczyk Switzerland
M.A. Passler United States
J. Rogozik Germany
S. Daiser relative to K. Stahrenberg Germany K. Stahrenberg's profile →
Citations per field
00.5×3.1×
K. Stahrenberg · 1×
Citations per year

Countries citing papers authored by S. Daiser

Since Specialization
Citations

This map shows the geographic impact of S. Daiser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Daiser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Daiser more than expected).

Fields of papers citing papers by S. Daiser

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Daiser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Daiser. The network helps show where S. Daiser may publish in the future.

Co-authors

The 8 scholars most cited alongside S. Daiser, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Daiser Line = papers co-authored together S. Daiser links everyone, so they are left out of the graph.

All Works

14 of 14 papers shown
#Work
1 1983123
2 198374
3 198560
4 198341
5 198537
6 198426
7 198415
8 198314
9 19848
10 19905
11 19882
12 19831
13 19871
14 19911

About S. Daiser

S. Daiser is a scholar working on Atomic and Molecular Physics, and Optics, Computational Mechanics, Surfaces, Coatings and Films, Electrical and Electronic Engineering and Materials Chemistry, having authored 14 papers that have together received 408 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (4 papers), Ion-surface interactions and analysis (4 papers), Quantum, superfluid, helium dynamics (3 papers), Gold and Silver Nanoparticles Synthesis and Applications (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), nanoparticles nucleation surface interactions (3 papers), Advanced Chemical Physics Studies (2 papers) and X-ray Spectroscopy and Fluorescence Analysis (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (65 citations), Atomic and Molecular Physics, and Optics (234 citations), Electronic, Optical and Magnetic Materials (131 citations), Atmospheric Science (120 citations) and Electrochemistry (40 citations). S. Daiser has collaborated with scholars based in Germany, United States and Spain. Frequent co-authors include K. Wandelt, Rodolfo Miranda, Ezequiel V. Albano, G. Ertl, N. Garcı́a, Michael A. Kelly, David Welkie and Christopher H. Becker. Their work appears in journals such as Surface Science, Physical Review Letters, Vacuum, Analytical and Bioanalytical Chemistry and IEEE Circuits and Devices Magazine.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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