Peter Stallhofer

400 citations
16 papers · 255 · h-index 8

Impact in

Papers in

Peter Stallhofer

15 papers receiving 225 citations

Peers

Peter Stallhofer
Comparison fields: 5 of 26
  • Atomic and Molecular Physics, and Optics 117
  • Electrical and Electronic Engineering 152
  • Surfaces, Coatings and Films 10
  • Radiation 10
  • Materials Chemistry 31
Replace Bart Onsia with:
Bart Onsia Belgium
C.G. Scott United Kingdom
M. Kubota Japan
Abdalla Naem Canada
N. Sugimoto Japan
Vincent Montgomery United Kingdom
Hiroshige Tezuka Japan
I. G. Gale United Kingdom
Madhavie Edirisooriya United States
S.G.H. Anderson United States
Peter Stallhofer relative to Bart Onsia Belgium Bart Onsia's profile →
Citations per field
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Citations per year

Countries citing papers authored by Peter Stallhofer

Since Specialization
Citations

This map shows the geographic impact of Peter Stallhofer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Stallhofer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Stallhofer more than expected).

Fields of papers citing papers by Peter Stallhofer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Stallhofer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Stallhofer. The network helps show where Peter Stallhofer may publish in the future.

Co-authors

The 25 scholars most cited alongside Peter Stallhofer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Peter Stallhofer Line = papers co-authored together Peter Stallhofer links everyone, so they are left out of the graph.

All Works

16 of 16 papers shown
#Work
1 197649
2 200644
3 198340
4 200331
5 197923
6 198416
7 19929
8 19929
9 20108
10 19877
11 19806
12 19784
13 19794
14 19842
15
High Purity Silicon 11
20102
16 20161

About Peter Stallhofer

Peter Stallhofer is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Statistics, Probability and Uncertainty, having authored 16 papers that have together received 255 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (8 papers), Semiconductor materials and interfaces (6 papers), Semiconductor materials and devices (3 papers), Quantum and electron transport phenomena (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Solidification and crystal growth phenomena (2 papers), Ion-surface interactions and analysis (1 paper) and X-ray Diffraction in Crystallography (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (117 citations), Electrical and Electronic Engineering (152 citations), Surfaces, Coatings and Films (10 citations), Radiation (10 citations) and Materials Chemistry (31 citations). Peter Stallhofer has collaborated with scholars based in Germany, Japan and China. Frequent co-authors include J. P. Kotthaus, J. Frederick Koch, Michio Tajima, G. Abstreiter, Peter Klüfers, Jürgen Evers, M. Watanabe, W Murray Bullis, Robert I. Scace and R.W. Series. Their work appears in journals such as Journal of The Electrochemical Society, Solid State Communications, Surface Science, Japanese Journal of Applied Physics and Journal of Crystal Growth.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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