Peter Rieve

407 citations
16 papers · 317 · h-index 9

Impact in

Papers in

Peter Rieve

16 papers receiving 282 citations

Peers

Peter Rieve
Comparison fields: 5 of 32
  • Media Technology 62
  • Electrical and Electronic Engineering 284
  • Instrumentation 15
  • Aerospace Engineering 79
  • Polymers and Plastics 38
Replace C. Leyris with:
C. Leyris France
Jiwon Lee South Korea
R.J. Strain Germany
Xiong Jiang China
Takeshi Ichikawa Japan
Kedi Wu China
Dingyu Xu China
Shupeng Zhao China
Peter Rieve relative to C. Leyris France C. Leyris's profile →
Citations per field
00.5×2×4×6×8×9.5×
C. Leyris · 1×
Citations per year

Countries citing papers authored by Peter Rieve

Since Specialization
Citations

This map shows the geographic impact of Peter Rieve's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Rieve with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Rieve more than expected).

Fields of papers citing papers by Peter Rieve

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Rieve. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Rieve. The network helps show where Peter Rieve may publish in the future.

Co-authors

The 13 scholars most cited alongside Peter Rieve, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Peter Rieve Line = papers co-authored together Peter Rieve links everyone, so they are left out of the graph.

All Works

16 of 16 papers shown
#Work
1 2000139
2 199531
3 199425
4 200020
5 199820
6 199618
7 199415
8 199811
9 19999
10 19989
11 20028
12 19944
13 19963
14 20022
15 19982
16
Image Sensors in TFA Technology and their Applications for Image Pre-Processing
19981

About Peter Rieve

Peter Rieve is a scholar working on Electrical and Electronic Engineering, Media Technology, Aerospace Engineering, Materials Chemistry and Polymers and Plastics, having authored 16 papers that have together received 317 indexed citations. Recurring topics across this work include CCD and CMOS Imaging Sensors (14 papers), Thin-Film Transistor Technologies (10 papers), Silicon Nanostructures and Photoluminescence (6 papers), Infrared Target Detection Methodologies (5 papers), Image Processing Techniques and Applications (3 papers), Transition Metal Oxide Nanomaterials (2 papers), Silicon and Solar Cell Technologies (2 papers) and Advanced MEMS and NEMS Technologies (1 paper). The work is most often cited by research in Media Technology (62 citations), Electrical and Electronic Engineering (284 citations), Instrumentation (15 citations), Aerospace Engineering (79 citations) and Polymers and Plastics (38 citations). Peter Rieve has collaborated with scholars based in Germany, United States and Belgium. Frequent co-authors include Markus Böhm, Michael G. Sommer, H. Keller, Qi Fang Zhu, H. Stiebig, Bernd Heinz Schneider, Jonathan Schulte, Dietmar Knipp, Martin Wagner and Eric W. Roth. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of Non-Crystalline Solids, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE and MRS Proceedings.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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