P. Biegański

42 papers receiving 479 citations

Peers

P. Biegański
Comparison fields: 5 of 48
  • Electronic, Optical and Magnetic Materials 137
  • Materials Chemistry 312
  • Surfaces, Coatings and Films 36
  • Electrical and Electronic Engineering 277
  • Atomic and Molecular Physics, and Optics 115
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Eric Bersch United States
Alexander G. Banshchikov Russia
Anas Mouti United States
M. Badylevich Belgium
Yuanxun Liao Australia
Tianchong Zhang China
Xiang Zhen Xu France
Goro Shimaoka Japan
W. Schwarzacher United Kingdom
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Citations per field
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Citations per year

Countries citing papers authored by P. Biegański

Since Specialization
Citations

This map shows the geographic impact of P. Biegański's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Biegański with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Biegański more than expected).

Fields of papers citing papers by P. Biegański

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. Biegański. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Biegański. The network helps show where P. Biegański may publish in the future.

Co-authors

The 25 scholars most cited alongside P. Biegański, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. Biegański Line = papers co-authored together P. Biegański links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 44 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2015111
2 201570
3 201330
4 201226
5 198520
6 201418
7 201518
8 199317
9 200415
10 201313
11 198813
12 201513
13 201313
14 200112
15 199510
16 19889
17 19898
18 20188
19 19837
20 19977

About P. Biegański

P. Biegański is a scholar working on Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films, Materials Chemistry, Atomic and Molecular Physics, and Optics and Computational Mechanics, having authored 44 papers that have together received 491 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (13 papers), ZnO doping and properties (13 papers), Surface and Thin Film Phenomena (12 papers), Surface Roughness and Optical Measurements (9 papers), Optical Coatings and Gratings (8 papers), Semiconductor materials and devices (8 papers), Theoretical and Computational Physics (5 papers) and Copper-based nanomaterials and applications (4 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (137 citations), Materials Chemistry (312 citations), Surfaces, Coatings and Films (36 citations), Electrical and Electronic Engineering (277 citations) and Atomic and Molecular Physics, and Optics (115 citations). P. Biegański has collaborated with scholars based in Poland and Ukraine. Frequent co-authors include E. Zielony, Ewa Placzek-Popko, M. Godlewski, Rafal Pietruszka, B.S. Witkowski, Ł. Wachnicki, Krzysztof Kopalko, Sylwia Gierałtowska, Piotr A. Caban and Grzegorz Łuka. Their work appears in journals such as Vacuum, Thin Solid Films, Applied Optics, Solar Energy Materials and Solar Cells and Journal of Non-Crystalline Solids.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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